SEMILAB Trademark

Trademark Overview


On Thursday, September 26, 2019, a trademark application was filed for SEMILAB with the United States Patent and Trademark Office. The USPTO has given the SEMILAB trademark a serial number of 88632625. The federal status of this trademark filing is REGISTERED as of Tuesday, April 28, 2020. This trademark is owned by Semiconductor Physics Laboratory Co., Ltd.. The SEMILAB trademark is filed in the Computer & Software Products & Electrical & Scientific Products and Computer & Software Services & Scientific Services categories with the following description:

Scientific instruments in the field of semiconductor manufacturing, namely, metrology instruments for contamination monitoring, defect inspection, contamination analysis, nano surface characterization, EPI resistivity measurement, EPI thickness measurement, compound material characterization, ion implant monitoring, thin film thickness measurement, electrical characterization of dielectrics and interfaces, characterization of 3D structures, metallization control, and dielectric porosity measurement; Photovoltaic instruments for controlling the crystalline silicon solar cell manufacturing process, namely, instruments for silicon ingot and block testing, silicon wafer sorting, inline process control, offline process control, laboratory applications, and thin film applications; Scientific instruments for monitoring the production of flat panel displays, namely, instruments for monitoring the manufacturing of full-tone and half tone (photoresist), printed OLED sub-pixel characterization, I...

Research and development in the field of semiconductor metrology, photovoltaic metrology, and flat panel display metrology; Custom design of metrology equipment to the specification of others
semilab

General Information


Serial Number88632625
Word MarkSEMILAB
Filing DateThursday, September 26, 2019
Status700 - REGISTERED
Status DateTuesday, April 28, 2020
Registration Number6042056
Registration DateTuesday, April 28, 2020
Mark Drawing4 - Illustration: Drawing with word(s) / letter(s) / number(s) in Block form
Published for Opposition DateTuesday, February 11, 2020

Trademark Statements


Goods and ServicesScientific instruments in the field of semiconductor manufacturing, namely, metrology instruments for contamination monitoring, defect inspection, contamination analysis, nano surface characterization, EPI resistivity measurement, EPI thickness measurement, compound material characterization, ion implant monitoring, thin film thickness measurement, electrical characterization of dielectrics and interfaces, characterization of 3D structures, metallization control, and dielectric porosity measurement; Photovoltaic instruments for controlling the crystalline silicon solar cell manufacturing process, namely, instruments for silicon ingot and block testing, silicon wafer sorting, inline process control, offline process control, laboratory applications, and thin film applications; Scientific instruments for monitoring the production of flat panel displays, namely, instruments for monitoring the manufacturing of full-tone and half tone (photoresist), printed OLED sub-pixel characterization, IGZO electrical characterization, sheet resistance measurement, thin film characterization, ELA process characterization (LTPS), and bare glass
Pseudo MarkSEMI LAB
Goods and ServicesResearch and development in the field of semiconductor metrology, photovoltaic metrology, and flat panel display metrology; Custom design of metrology equipment to the specification of others

Classification Information


International Class009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
US Class Codes021, 023, 026, 036, 038
Class Status Code6 - Active
Class Status DateWednesday, October 2, 2019
Primary Code009
First Use Anywhere DateThursday, June 11, 2009
First Use In Commerce DateThursday, June 11, 2009

International Class042 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software.
US Class Codes100, 101
Class Status Code6 - Active
Class Status DateWednesday, October 2, 2019
Primary Code042
First Use Anywhere DateThursday, June 11, 2009
First Use In Commerce DateThursday, June 11, 2009

Trademark Owner History


Party NameSemiconductor Physics Laboratory Co., Ltd.
Party Type30 - Original Registrant
Legal Entity Type03 - Corporation
AddressBudapest H-1117
HU

Party NameSemiconductor Physics Laboratory Co., Ltd.
Party Type20 - Owner at Publication
Legal Entity Type03 - Corporation
AddressBudapest H-1117
HU

Party NameSemiconductor Physics Laboratory Co., Ltd.
Party Type10 - Original Applicant
Legal Entity Type03 - Corporation
AddressBudapest H-1117
HU

Trademark Events


Event DateEvent Description
Monday, September 30, 2019NEW APPLICATION ENTERED
Wednesday, October 2, 2019NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
Monday, December 30, 2019ASSIGNED TO EXAMINER
Friday, January 3, 2020APPROVED FOR PUB - PRINCIPAL REGISTER
Wednesday, January 22, 2020NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
Tuesday, February 11, 2020PUBLISHED FOR OPPOSITION
Tuesday, February 11, 2020OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
Tuesday, April 28, 2020REGISTERED-PRINCIPAL REGISTER
Wednesday, June 5, 2024TEAS SECTION 7 REQUEST RECEIVED