Optical and electrical measuring devices, namely, semiconductor testing apparatus and scientific instruments for the inspection of semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures, for determining their physical and chemical properties, namely, layer thickness, hardness, dopant and/or contaminant concentration and electrical conductivity, and for detecting surface irregularities, crystal defects an...

Scientific instruments in the field of semiconductor manufacturing, namely, metrology instruments for contamination monitoring, defect inspection, contamination analysis, nano surface characterization, EPI resistivity measurement, EPI thickness measurement, compound material characterization, ion implant monitoring, thin film thickness measurement, electrical characterization of dielectrics and interfaces, characterization of 3D structures, metallization control, and dielectric porosity measu...

spectrometer, optical and mechanical scanner, profilograph

spectrometer, optical and mechanical scanner, profilograph