Metrology tool for optically measuring properties of semiconductor wafers at various stages during fabrication of semiconductor devices, including an optical sensor, a wafer-support stage, electronic data processing means, and mechanical and software interfaces for integration with wafer-loading tools and wafer-processing tools

Publications, namely magazines relating to the field of solid state technology

Educational and training services, namely, conducting classes, seminars, conferences and workshops in the field of precision measurement, surface, angle, contour, form, diameter and roundness measurement, metrology and design of virtual parts

Providing a showroom for displaying the goods of others, distributorship services, and manufacturer representative services, all in the field of dimensional measurement tools, gages, instruments and systems

Providing a showroom for displaying the goods of others, distributorship services, and manufacturer representative services, all in the field of dimensional measurement tools, gages, instruments and systems

Education services, namely, educational and training seminars and instruction through courses, programs, symposiums, meetings and workshops relating to metrology and calibration

Instruments for use in geometrical inspection of industrial components, medical devices, and aerospace applications; computer hardware and related downloadable computer software for controlling instruments for use in geometrical inspection of industrial components, medical devices, and aerospace applications

electronic apparatus for reading natural gas flow charts

Diagnostic equipment and operational software for the inspection, review and measurement of semiconductor elements in the nature of wafers, reticles, and flat panel displays

Calibration

Computer programs for use in database management in asset management and maintenance systems

Computer software for the exchange of metrological data between computer systems using scalable and service-based architecture

Accessories for coordinate measuring machines, namely, probes, tripods and mounts, targets, tooling, namely, target holders, target adapters, ball probe holders, and ball probe adapters; and calibrated reference geometries, namely, ball bars, scale bars, certified spheres, and reference spheres