| Serial Number | 79425805 |
| Word Mark | XTROLOGY |
| Filing Date | Thursday, April 3, 2025 |
| Status | 641 - NON-FINAL ACTION - MAILED |
| Status Date | Thursday, October 30, 2025 |
| Registration Number | 0000000 |
| Registration Date | NOT AVAILABLE |
| Mark Drawing | 4 - Illustration: Drawing with word(s) / letter(s) / number(s) in Block form |
| Published for Opposition Date | NOT AVAILABLE |
| Goods and Services | Semiconductor wafer inspection apparatus; analyzing apparatus for defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers; semiconductor wafer measuring apparatus; semiconductor wafer testing apparatus; semiconductor photomask inspection apparatus; analyzing apparatus for defect of semiconductor photomasks; analyzing apparatus for stress of semiconductor photomasks; analyzing apparatus for composition of semiconductor photomasks; semiconductor photomask measuring apparatus; semiconductor photomask testing apparatus; semiconductor reticle inspection apparatus; analyzing apparatus for defect of semiconductor reticles; analyzing apparatus for stress of semiconductor reticles; analyzing apparatus for composition of semiconductor reticles; semiconductor reticle measuring apparatus; semiconductor reticle testing apparatus; semiconductor substrate inspection apparatus; analyzing apparatus for defect of semiconductor substrates; analyzing apparatus for stress of semiconductor substrates; analyzing apparatus for composition of semiconductor substrates; semiconductor substrate measuring apparatus; semiconductor substrate testing apparatus; sensors for mapping semiconductor wafers; Raman spectrographic measurement apparatus, and parts and accessories therefor; Raman spectroscopic analyzing apparatus, and parts and accessories therefor; measuring apparatus for measuring film thickness; measuring apparatus for spectral measurements; automated optical inspection apparatus; X-ray fluorescence measuring apparatus; measuring or testing machines and instruments, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrometers, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrographs, and parts and accessories therefor; optical machines and apparatus; photographic machines and apparatus; cinematographic machines and apparatus; laboratory apparatus and instruments; computer software for inspection, defect analysis, stress analysis, composition analysis, measurement and testing of semiconductor wafers, photomasks, reticles and substrates; computer software; computer programs; scanning probe microscopes; X-ray fluorescence analyzing apparatus; electronic computer and data processing machines and apparatus and their parts; power distribution or control machines and apparatus; rotary converters; phase modifiers; batteries and cells; electric or magnetic meters and testers; electric wires and cables; spectacles [eyeglasses and goggles]; life-saving apparatus and equipment; telecommunication machines and apparatus; fire alarms; gas alarms; water leak alarms; oil leak alarms; anti-theft warning apparatus. |
| International Class | 009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus. |
| US Class Codes | 021, 023, 026, 036, 038 |
| Class Status Code | 6 - Active |
| Class Status Date | Thursday, June 12, 2025 |
| Primary Code | 009 |
| First Use Anywhere Date | NOT AVAILABLE |
| First Use In Commerce Date | NOT AVAILABLE |
| Party Name | HORIBA STEC, Co., Ltd. |
| Party Type | 10 - Original Applicant |
| Legal Entity Type | 03 - Corporation |
| Address | JP |
| Event Date | Event Description |
| Thursday, June 12, 2025 | SN ASSIGNED FOR SECT 66A APPL FROM IB |
| Friday, June 13, 2025 | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED |
| Friday, June 13, 2025 | APPLICATION FILING RECEIPT MAILED |
| Monday, September 1, 2025 | ASSIGNED TO EXAMINER |
| Thursday, September 11, 2025 | NON-FINAL ACTION WRITTEN |
| Friday, September 12, 2025 | NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW |
| Thursday, October 30, 2025 | REFUSAL PROCESSED BY MPU |
| Thursday, October 30, 2025 | NON-FINAL ACTION MAILED - REFUSAL SENT TO IB |