XTROLOGY
Semiconductor wafer inspection apparatus, namely, inspection machines for the physical inspection of semiconductor wafers; analyzing apparatus for defect of semiconductor wafers, namely, optical analyzers for analyzing defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers, namely, optical analyzers for analyzing stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers, namely, optical analyzers for analyzing composition of se...
Pending · April 3, 2025 · 79425805 ·
