| Serial Number | 79379311 |
| Word Mark | UNITY SEMICONDUCTOR |
| Filing Date | Thursday, August 10, 2023 |
| Status | 649 - ACTION CONTINUING FINAL - MAILED |
| Status Date | Thursday, December 12, 2024 |
| Registration Number | 0000000 |
| Registration Date | NOT AVAILABLE |
| Mark Drawing | 4 - Illustration: Drawing with word(s) / letter(s) / number(s) in Block form |
| Published for Opposition Date | NOT AVAILABLE |
| Goods and Services | Inspection devices and systems for the semiconductor, micro-optics and micro-electromechanical systems industries, namely industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices, for imaging, inspection, thickness layer measurement, surface profile measurement, critical dimensions measurement, overlay measurement, and process control and characterization; optical inspection systems, devices and sensors, namely, industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices for imaging, dark field and scattering detection, deflectometry, and fluorescence detection; metrology and dimensional control devices and systems for the semiconductor, micro-optics and micro-electromechanical systems industries, namely, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography imaging devices; optical metrology sensors, devices and systems, namely, sensors, devices, and systems comprised of camera, laser, light source, translation and rotation stage, robots, computer, display screen, and frames |
| Goods and Services | Installation, maintenance and repair of machines, namely industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices, for imaging, inspection, thickness layer measurement, surface profile measurement, critical dimensions measurement, overlay measurement, and process control and characterization |
| NOT AVAILABLE | "SEMICONDUCTOR" |
| Goods and Services | Engineering services in the field of semiconductor, micro-optics, and micro-electromechanical systems inspection and metrology |
| International Class | 009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus. |
| US Class Codes | 021, 023, 026, 036, 038 |
| Class Status Code | 6 - Active |
| Class Status Date | Friday, September 22, 2023 |
| Primary Code | 009 |
| First Use Anywhere Date | NOT AVAILABLE |
| First Use In Commerce Date | NOT AVAILABLE |
| International Class | 037 - Building construction; repair; installation services. |
| US Class Codes | 100, 103, 106 |
| Class Status Code | 6 - Active |
| Class Status Date | Friday, September 22, 2023 |
| Primary Code | 037 |
| First Use Anywhere Date | NOT AVAILABLE |
| First Use In Commerce Date | NOT AVAILABLE |
| International Class | 042 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software. |
| US Class Codes | 100, 101 |
| Class Status Code | 6 - Active |
| Class Status Date | Friday, September 22, 2023 |
| Primary Code | 042 |
| First Use Anywhere Date | NOT AVAILABLE |
| First Use In Commerce Date | NOT AVAILABLE |
| Party Name | UNITY-SC |
| Party Type | 10 - Original Applicant |
| Legal Entity Type | 99 - Other |
| Address | FR |
| Event Date | Event Description |
| Thursday, September 21, 2023 | SN ASSIGNED FOR SECT 66A APPL FROM IB |
| Friday, September 22, 2023 | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED |
| Tuesday, September 26, 2023 | APPLICATION FILING RECEIPT MAILED |
| Thursday, April 11, 2024 | ASSIGNED TO EXAMINER |
| Wednesday, April 24, 2024 | NON-FINAL ACTION WRITTEN |
| Thursday, April 25, 2024 | NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW |
| Wednesday, May 1, 2024 | REFUSAL PROCESSED BY MPU |
| Thursday, May 2, 2024 | NON-FINAL ACTION MAILED - REFUSAL SENT TO IB |
| Wednesday, May 22, 2024 | REFUSAL PROCESSED BY IB |
| Wednesday, July 17, 2024 | TEAS/EMAIL CORRESPONDENCE ENTERED |
| Wednesday, July 17, 2024 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| Wednesday, July 17, 2024 | TEAS RESPONSE TO OFFICE ACTION RECEIVED |
| Thursday, September 5, 2024 | NOTIFICATION OF FINAL REFUSAL EMAILED |
| Thursday, September 5, 2024 | FINAL REFUSAL WRITTEN |
| Thursday, September 5, 2024 | FINAL REFUSAL E-MAILED |
| Monday, September 23, 2024 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| Monday, September 23, 2024 | TEAS REQUEST FOR RECONSIDERATION RECEIVED |
| Tuesday, September 24, 2024 | TEAS/EMAIL CORRESPONDENCE ENTERED |
| Thursday, December 12, 2024 | ACTION REQ FOR RECON DENIED NO APPEAL FILED COUNTED NOT MAILED |
| Thursday, December 12, 2024 | ACTION FOR REQ FOR RECON DENIED NO APPEAL FILED E-MAILED |
| Thursday, December 12, 2024 | NOTIFICATION FOR REQ FOR RECON DENIED NO APPEAL FILED |