Metrology instruments, namely, scanning probe microscopes

Roof coverings, not of metal; roof flashing, not of metal; roof gutters, not of metal; roofing boards; roofing comprised primarily of tensile fabric membranes; roofing fabrics; roofing tiles, not of metal; roofing underlayment; roofing, not of metal, incorporating photovoltaic cells; ceramic roofing tiles; clay roofing tiles; non-metal roofing; non-metal roofing hips; non-metal roofing panels; non-metal roofing tiles; PVC roofing membrane; slates for roof cladding

Ferrous alloys; irons and steels

bicycles, bicycle parts, bicycle bearings, bicycle accessories, boats, personal watercraft, small powerboats, personal jet boats, water scooters, recreational watercraft

AUTOMOTIVE PARTS, NAMELY, STEEL CLAD ALUMINUM BRAKE ROTORS

Baseball bats; Softball bats; Tennis racquets, baseball bats, cricket bats, golf clubs and hockey sticks; Fishing rod holders; Fishing rods; Fishing tackle; Reels for fishing; Rods for fishing; Fishing reels; Fishing rod blanks; Archery equipment, namely, non-telescopic bow sights; Archery equipment, namely, open bow sights; Archery equipment, namely, arrow, archery bows; Ski poles; Ski sticks; Trekking poles; Field hockey sticks; Hockey sticks; Ice skate blades; Ice skates; In-line roller sk...

gas filters for semiconductor manufacturing

Surgical implants comprising artificial material; coatings sold as an integral component of implantable medical devices

Surgical implants comprising artificial material; coatings sold as an integral component of implantable medical devices

Electric locks

Brochures and newsletters published periodically regarding equipment and machines for the processing and production of semiconductor substrates, thin films, silicon discs and wafers; semiconductor processing and production equipment manuals; and technical reports featuring information regarding equipment and machines for the processing and production of semiconductor substrates thin films, silicon disks and wafers

Teaching in the field of hypnotism

Scientific instrument for metrology applications, namely, a metrology unit which is used to measure the critical dimensions and overlay registration achieved in submicron optical lithography

Skin care and anti-aging products, namely, skin creams, soaps, scrubs, toners, lotions, non-medicated serums, moisturizers, gels, conditioners, cleansing preparations; body massage creams and oils

Golf clubs[, tennis rackets, ] and badminton rackets

Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other...

Educational services, namely, conducting programs and training in the field of seismology and geophysics

scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials

Electro-Optical Instruments for Measuring Microscopic Objects

Chemicals and plastics composite material in the form of nano and micro thick monolayers; ; Chemicals and plastics composite material in the form of ultra thin films and carbon nanotubes; ; Chemicals and plastics composite material in the form of ultra thin films and carbon nanotubes

surface measuring systems, namely, surface profilers and scatterometers of both contact and non-contact types for use in the machinery and equipment manufacture and electronics and semiconductor industries

Computer software and hardware for scanning microscopes

NON-CONTACT OPTICAL IMAGING HARDWARE AND ASSOCIATED SOFTWARE FOR CHARACTERIZING THE SURFACE OF A SUBSTRATE SUCH AS A SEMICONDUCTOR WAFER