| Serial Number | 97308047 |
| Word Mark | NANOMETRICS |
| Filing Date | Friday, March 11, 2022 |
| Status | 819 - SU - REGISTRATION REVIEW COMPLETE |
| Status Date | Friday, May 31, 2024 |
| Registration Number | 0000000 |
| Registration Date | NOT AVAILABLE |
| Mark Drawing | 4 - Illustration: Drawing with word(s) / letter(s) / number(s) in Block form |
| Published for Opposition Date | Tuesday, April 4, 2023 |
| Goods and Services | Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; interferometers for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; downloadable software, namely, process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; downloadable software for the semiconductor industry, namely, downloadable software for identifying defects in semiconductor structures, downloadable software for identifying semiconductor fabrication process excursions, downloadable software for recording and reviewing defects in semiconductors structures, downloadable software for identifying root causes of defects in semiconductor structures, and downloadable software for controlling and monitoring semiconductor fabrication equipment; metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with embedded computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; optical inspection equipment for 2D and 3D inspection of semiconductor materials; metrology instruments for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometers |
| Goods and Services | Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors on laminar substrates including wafers, glass panels, and packaging panels such as copper plate or plastic; Optical metrology, characterization, and inspection systems comprised of a machine, components and operating software therefor sold as a unit for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the production of precision machined optical surfaces, optical coatings, and optical assemblies including reference flat, sphere, asphere and assemblies composed of both refractive and reflective components |
| Goods and Services | Providing temporary use on online, non-downloadable process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogenous packaging, and other advanced packaging electronics technologies; providing online non-downloadable software for the semiconductor industry, namely, online non-downloadable software for identifying defects in semiconductor structures, online non-downloadable software for identifying semiconductor fabrication process excursions, online non-downloadable software for recording and reviewing defects in semiconductors structures, online non-downloadable software for identifying root causes of defects in semiconductor structures, and online non-downloadable software for controlling and monitoring semiconductor fabrication equipment |
| International Class | 007 - Machines and machine tools; motors and engines (except for land vehicles); machine coupling and transmission components (except for land vehicles); agricultural implements other than hand-operated; incubators for eggs. |
| US Class Codes | 013, 019, 021, 023, 024, 031, 034, 035 |
| Class Status Code | 6 - Active |
| Class Status Date | Wednesday, March 16, 2022 |
| Primary Code | 007 |
| First Use Anywhere Date | Friday, September 1, 2023 |
| First Use In Commerce Date | Friday, September 1, 2023 |
| International Class | 009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus. |
| US Class Codes | 021, 023, 026, 036, 038 |
| Class Status Code | 6 - Active |
| Class Status Date | Wednesday, March 16, 2022 |
| Primary Code | 009 |
| First Use Anywhere Date | Tuesday, December 14, 1976 |
| First Use In Commerce Date | Tuesday, December 14, 1976 |
| International Class | 042 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software. |
| US Class Codes | 100, 101 |
| Class Status Code | 6 - Active |
| Class Status Date | Wednesday, March 16, 2022 |
| Primary Code | 042 |
| First Use Anywhere Date | Friday, March 29, 2024 |
| First Use In Commerce Date | Friday, March 29, 2024 |
| Party Name | Onto Innovation Inc. |
| Party Type | 20 - Owner at Publication |
| Legal Entity Type | 03 - Corporation |
| Address | Wilmington, MA 01887 |
| Party Name | Onto Innovation Inc. |
| Party Type | 10 - Original Applicant |
| Legal Entity Type | 03 - Corporation |
| Address | Wilmington, MA 01887 |
| Event Date | Event Description |
| Tuesday, March 15, 2022 | NEW APPLICATION ENTERED |
| Wednesday, March 16, 2022 | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED |
| Monday, May 2, 2022 | ASSIGNED TO EXAMINER |
| Tuesday, August 30, 2022 | NON-FINAL ACTION WRITTEN |
| Tuesday, August 30, 2022 | NON-FINAL ACTION E-MAILED |
| Tuesday, August 30, 2022 | NOTIFICATION OF NON-FINAL ACTION E-MAILED |
| Tuesday, February 28, 2023 | TEAS RESPONSE TO OFFICE ACTION RECEIVED |
| Tuesday, February 28, 2023 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| Wednesday, March 1, 2023 | TEAS/EMAIL CORRESPONDENCE ENTERED |
| Wednesday, March 1, 2023 | APPROVED FOR PUB - PRINCIPAL REGISTER |
| Wednesday, March 15, 2023 | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED |
| Tuesday, April 4, 2023 | PUBLISHED FOR OPPOSITION |
| Tuesday, April 4, 2023 | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED |
| Thursday, November 30, 2023 | SOU TEAS EXTENSION RECEIVED |
| Tuesday, May 30, 2023 | NOA E-MAILED - SOU REQUIRED FROM APPLICANT |
| Thursday, November 30, 2023 | SOU EXTENSION 1 FILED |
| Thursday, November 30, 2023 | SOU EXTENSION 1 GRANTED |
| Tuesday, April 30, 2024 | USE AMENDMENT FILED |
| Tuesday, May 28, 2024 | CASE ASSIGNED TO INTENT TO USE PARALEGAL |
| Wednesday, May 29, 2024 | STATEMENT OF USE PROCESSING COMPLETE |
| Saturday, December 2, 2023 | NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED |
| Tuesday, April 30, 2024 | TEAS STATEMENT OF USE RECEIVED |
| Friday, May 31, 2024 | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED |
| Friday, May 31, 2024 | NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED |