GAIA
Imaging metrology tools, namely, scientific and electronic imaging instruments for inspecting and characterizing physical properties, including micro-bump arrays, of semiconductors, integrated circuits, and microelectronics, and their packaging; Computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, and microelectronics; Optical inspection apparatus for inspection of semiconductor materi...
Pending · May 27, 2025 · 99204250 ·