CONNECTED METROLOGY Trademark
Trademark Overview
On Thursday, July 4, 2024, a trademark application was filed for CONNECTED METROLOGY with the United States Patent and Trademark Office. The USPTO has given the CONNECTED METROLOGY trademark a serial number of 79404432. The federal status of this trademark filing is NEW APPLICATION - RECORD INITIALIZED NOT ASSIGNED TO EXAMINER as of Thursday, September 12, 2024. This trademark is owned by LayTec Aktiengesellschaft. The CONNECTED METROLOGY trademark is filed in the Computer & Software Products & Electrical & Scientific Products category with the following description:
Software and framework for aggregating and combining measurement parameters of semiconductor wafers in the production of semiconductor devices; software for analysing and interpreting in-situ and in-line measurement parameters before, during and after thin film deposition, thin film etching and other treatment and characterisation steps; software for improving the yield and the stability of production processes and their analysis results for statistical process control in the production of semiconductor devices.
General Information
| Serial Number | 79404432 |
| Word Mark | CONNECTED METROLOGY |
| Filing Date | Thursday, July 4, 2024 |
| Status | 630 - NEW APPLICATION - RECORD INITIALIZED NOT ASSIGNED TO EXAMINER |
| Status Date | Thursday, September 12, 2024 |
| Registration Number | 0000000 |
| Registration Date | NOT AVAILABLE |
| Mark Drawing | 3 - Illustration: Drawing or design which also includes word(s) / letter(s) / number(s) |
| Published for Opposition Date | NOT AVAILABLE |
Trademark Statements
| Goods and Services | Software and framework for aggregating and combining measurement parameters of semiconductor wafers in the production of semiconductor devices; software for analysing and interpreting in-situ and in-line measurement parameters before, during and after thin film deposition, thin film etching and other treatment and characterisation steps; software for improving the yield and the stability of production processes and their analysis results for statistical process control in the production of semiconductor devices. |
Classification Information
| International Class | 009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus. |
| US Class Codes | 021, 023, 026, 036, 038 |
| Class Status Code | 6 - Active |
| Class Status Date | Thursday, September 12, 2024 |
| Primary Code | 009 |
| First Use Anywhere Date | NOT AVAILABLE |
| First Use In Commerce Date | NOT AVAILABLE |
Trademark Owner History
| Party Name | LayTec Aktiengesellschaft |
| Party Type | 10 - Original Applicant |
| Legal Entity Type | 25 - NOT AVAILABLE |
| Address | DE |
Trademark Events
| Event Date | Event Description |
| Thursday, September 12, 2024 | SN ASSIGNED FOR SECT 66A APPL FROM IB |
| Tuesday, September 17, 2024 | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED |
| Tuesday, September 17, 2024 | APPLICATION FILING RECEIPT MAILED |
