XENOCS Trademark

Trademark Overview


On Friday, August 23, 2024, a trademark application was filed for XENOCS with the United States Patent and Trademark Office. The USPTO has given the XENOCS trademark a serial number of 98714488. The federal status of this trademark filing is NEW APPLICATION - RECORD INITIALIZED NOT ASSIGNED TO EXAMINER as of Friday, August 23, 2024. This trademark is owned by XENOCS SAS. The XENOCS trademark is filed in the Computer & Software Products & Electrical & Scientific Products and Computer & Software Services & Scientific Services categories with the following description:

(Based on 44(d) Priority Application) Measuring apparatus and instruments, namely X-ray apparatus not for medical purposes in the nature of x-ray radiography instruments, x-ray imaging instruments, x-ray scattering instruments; Scientific apparatus and instruments, namely, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments, X-ray imaging instruments, x-ray scattering instruments, for examining material structures and particle size analysis; Sensors for measuring distance to an object, not for medical use; Laboratory apparatus and instruments, namely, X-ray apparatus not for medical purposes, optical time-domain reflectometers, X-ray imaging modules for X-ray apparatus not for medical purposes in the nature of X-ray scattering measurements, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments and X-ray imaging apparatus; Measuring, regulating and testing apparatus, namely, x-ray fluorescence analyzers, other than fo...

(Based on 44(d) Priority Application) Advisory services relating to science, namely, scientific research consulting; Advisory services relating to scientific instruments, namely, product development consultation; scientific analytical laboratory services; Calibration of instruments; Professional consultancy relating to technology; Industrial research; Scientific analytical laboratory services; Leasing of scientific instruments, namely, rental of laboratory apparatus and instruments; Rental of measuring apparatus; Preparation of project analysis studies and analysis, namely, scientific research; scientific research consulting, namely, preparation of reports relating to scientific research; Preparation of technical manuals, namely, scientific research; Providing science technology information; Provision of scientific information; product research and development services; product research in instrumentation; product research in measurement technology; Scientific research consulting; scie...

General Information


Serial Number98714488
Word MarkXENOCS
Filing DateFriday, August 23, 2024
Status630 - NEW APPLICATION - RECORD INITIALIZED NOT ASSIGNED TO EXAMINER
Status DateFriday, August 23, 2024
Registration Number0000000
Registration DateNOT AVAILABLE
Mark Drawing4 - Illustration: Drawing with word(s) / letter(s) / number(s) in Block form
Published for Opposition DateNOT AVAILABLE

Trademark Statements


Goods and Services(Based on 44(d) Priority Application) Measuring apparatus and instruments, namely X-ray apparatus not for medical purposes in the nature of x-ray radiography instruments, x-ray imaging instruments, x-ray scattering instruments; Scientific apparatus and instruments, namely, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments, X-ray imaging instruments, x-ray scattering instruments, for examining material structures and particle size analysis; Sensors for measuring distance to an object, not for medical use; Laboratory apparatus and instruments, namely, X-ray apparatus not for medical purposes, optical time-domain reflectometers, X-ray imaging modules for X-ray apparatus not for medical purposes in the nature of X-ray scattering measurements, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments and X-ray imaging apparatus; Measuring, regulating and testing apparatus, namely, x-ray fluorescence analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures and for analysis of the macrostructure of materials; Display and checking (supervision) apparatus; Apparatus and instruments for industrial process monitoring and control, namely, X-ray apparatus not for medical purposes in the nature of X-ray scattering instruments; downloadable software for scientific applications, materials research, and/or for modelling the structure of nanomaterials and computer hardware; Measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; Optical devices, enhancers and correctors, namely, spectrometers; Scientific research and laboratory apparatus, educational apparatus and simulators, namely, X-ray apparatus, not for medical purposes; Radiological apparatus for industrial purposes, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; X-ray analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; X-ray imaging instruments, small angle and wide angle X-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, RNA or biological macromolecules in solution; Particle detecting apparatus, namely, X-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; X-ray detection apparatus, visible light detection apparatus, infrared detection apparatus and UV detection apparatus; Electronic sensors; Electro-optical sensors; Interfaces for detectors; Magnetic object detectors; Optical sensors; X-ray imaging instruments for materials research, small angle and wide angle X-ray scattering instruments for measuring nanoscale particle sizes and particle size analysis; Photoelectric sensors; Photoionic detectors; Measuring devices, electric, namely, clamp meters for measuring electricity; Instruments for surveying physical data; Radiation-measuring instruments; optical time-domain reflectometers; Scientific apparatus, namely, spectrometers; Data processing equipment, namely, computers; Computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; X-ray producing apparatus and installations, not for medical purposes; Radiological apparatus for industrial purposes; X-ray analysers, other than for medical purposes; structural and replacement parts and fittings for all the aforesaid goods; (Based on 44(e)) ; Measuring apparatus and instruments, namely X-ray apparatus not for medical purposes in the nature of x-ray radiography instruments, x-ray imaging instruments, x-ray scattering instruments; Scientific apparatus and instruments, namely, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments, X-ray imaging instruments, x-ray scattering instruments, for examining material structures and particle size analysis; Sensors for measuring distance to an object, not for medical use; Laboratory apparatus and instruments, namely, X-ray apparatus not for medical purposes, optical time-domain reflectometers, X-ray imaging modules for X-ray apparatus not for medical purposes in the nature of X-ray scattering measurements, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments and X-ray imaging apparatus; Measuring, regulating and testing apparatus, namely, x-ray fluorescence analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures and for analysis of the macrostructure of materials; Display and checking (supervision) apparatus; Apparatus and instruments for industrial process monitoring and control, namely, X-ray apparatus not for medical purposes in the nature of X-ray scattering instruments; downloadable software for scientific applications, materials research, and/or for modelling the structure of nanomaterials and computer hardware; Measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; Optical devices, enhancers and correctors, namely, spectrometers; Scientific research and laboratory apparatus, educational apparatus and simulators, namely, X-ray apparatus, not for medical purposes; Radiological apparatus for industrial purposes, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; X-ray analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; X-ray imaging instruments, small angle and wide angle X-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, RNA or biological macromolecules in solution; Particle detecting apparatus, namely, X-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; X-ray detection apparatus, visible light detection apparatus, infrared detection apparatus and UV detection apparatus; Electronic sensors; Electro-optical sensors; Interfaces for detectors; Magnetic object detectors; Optical sensors; X-ray imaging instruments for materials research, small angle and wide angle X-ray scattering instruments for measuring nanoscale particle sizes and particle size analysis; Photoelectric sensors; Photoionic detectors; Measuring devices, electric, namely, clamp meters for measuring electricity; Instruments for surveying physical data; Radiation-measuring instruments; optical time-domain reflectometers; Scientific apparatus, namely, spectrometers; Data processing equipment, namely, computers; Computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; X-ray producing apparatus and installations, not for medical purposes; Radiological apparatus for industrial purposes; X-ray analysers, other than for medical purposes; structural and replacement parts and fittings for all the aforesaid goods
Goods and Services(Based on 44(d) Priority Application) Advisory services relating to science, namely, scientific research consulting; Advisory services relating to scientific instruments, namely, product development consultation; scientific analytical laboratory services; Calibration of instruments; Professional consultancy relating to technology; Industrial research; Scientific analytical laboratory services; Leasing of scientific instruments, namely, rental of laboratory apparatus and instruments; Rental of measuring apparatus; Preparation of project analysis studies and analysis, namely, scientific research; scientific research consulting, namely, preparation of reports relating to scientific research; Preparation of technical manuals, namely, scientific research; Providing science technology information; Provision of scientific information; product research and development services; product research in instrumentation; product research in measurement technology; Scientific research consulting; scientific and technological research services, namely, scientific research, analysis, testing; rental and leasing in relation to the aforesaid services, namely, rental of laboratory apparatus and instruments and rental of measuring apparatus; Consultancy and information in relation to the aforesaid services; all the aforesaid services in particular relating to, X-ray imaging for materials research, or X-ray scattering for examining material structures and crystal properties; the fields of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; materials research, development and production control in the fields of polymers, nanocomposites, biomaterials, alloys; analysis of the macrostructure; detection of structural inhomogeneities, defects, voids, pores, aggregations, interfaces in materials; (Based on 44(e)) ; Advisory services relating to science, namely, scientific research consulting; Advisory services relating to scientific instruments, namely, product development consultation; scientific analytical laboratory services; Calibration of instruments; Professional consultancy relating to technology; Industrial research; Scientific analytical laboratory services; Leasing of scientific instruments, namely, rental of laboratory apparatus and instruments; Rental of measuring apparatus; Preparation of project analysis studies and analysis, namely, scientific research; scientific research consulting, namely, preparation of reports relating to scientific research; Preparation of technical manuals, namely, scientific research; Providing science technology information; Provision of scientific information; product research and development services; product research in instrumentation; product research in measurement technology; Scientific research consulting; scientific and technological research services, namely, scientific research, analysis, testing; rental and leasing in relation to the aforesaid services, namely, rental of laboratory apparatus and instruments and rental of measuring apparatus; Consultancy and information in relation to the aforesaid services; all the aforesaid services in particular relating to, X-ray imaging for materials research, or X-ray scattering for examining material structures and crystal properties; the fields of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; materials research, development and production control in the fields of polymers, nanocomposites, biomaterials, alloys; analysis of the macrostructure; detection of structural inhomogeneities, defects, voids, pores, aggregations, interfaces in materials

Classification Information


International Class009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
US Class Codes021, 023, 026, 036, 038
Class Status Code6 - Active
Class Status DateFriday, August 23, 2024
Primary Code009
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

International Class042 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software.
US Class Codes100, 101
Class Status Code6 - Active
Class Status DateFriday, August 23, 2024
Primary Code042
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

Trademark Owner History


Party NameXENOCS SAS
Party Type10 - Original Applicant
Legal Entity Type99 - Other
AddressGrenoble 38000
FR

Trademark Events


Event DateEvent Description
Friday, August 23, 2024NEW APPLICATION ENTERED