| Serial Number | 87671293 |
| Word Mark | TEMIC |
| Filing Date | Friday, November 3, 2017 |
| Status | 700 - REGISTERED |
| Status Date | Tuesday, December 31, 2019 |
| Registration Number | 5950681 |
| Registration Date | Tuesday, December 31, 2019 |
| Mark Drawing | 3000 - Illustration: Drawing or design which also includes word(s) / letter(s) / number(s) |
| Published for Opposition Date | Tuesday, February 12, 2019 |
| Description of Mark | The mark consists of the stylized word "TEMIC" with the letters "TEMC" in black and the letter "I" in blue with a triangle design at the base and a blue circle at the top. |
| Goods and Services | Optical apparatus and instruments, namely, electron microscopes; Hardware, namely, electronic and optical apparatus for use in inspection and measurement of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples in particular for microscopic examination and quality control purposes; Electric and electronic apparatus and instruments, namely, for microscopic examination; Microscopes, electron microscopes and scanning electron microscopes; parts and fittings for all the aforesaid goods, namely, sample holders, lenses, lighting devices for microscopes; Scientific and laboratory research apparatus, teaching apparatus and simulators, namely, vacuum chambers with precision mechanical stages and electron optical lenses, control software, programs and software applications for the analysis of data generated by the electron-detectors of the microscopes, electron microscopes and scanning electron microscopes; Adapters for adapting a camera to a microscope; Electron microscopes; Scientific apparatus, namely, spectrometers and parts and fittings therefor; Mass spectrometers in the nature of scientific apparatus; Semiconductor objectives; Condensers for microscopes; Co-observation attachment in the nature of a lens, a detector, a specimen holder, an environmental temperature/humidity controller, an in-situ specimen manipulator, and a pretreatment device for microscope; Spectrometers, namely, X-Ray spectrometer for use in identifying and measuring elemental compositions of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples; Electronic and optical instruments for measuring surfaces; Calibration devices for calibrating the proper performance parameters of x-ray spectrometers used on electron microscopes, used to study the performance of various materials in the industrial and academic areas; Scientific Instruments, namely, optical microscopes, electron microscopes, spectrometers, chromatographs and automated medical assay apparatus for metrology measurement, microstructure imaging, composition analysis, chemical analysis, pathological examination and pathogens detection; Laboratory apparatus and instruments for measuring elemental compositions, namely, x-ray fluorescence spectrometers; Apparatus for preparing and introducing samples into x- ray fluorescence spectrometers; Computer application software for controlling x-ray fluorescence spectrometers and for analyzing spectrometric results, and replacement parts therefor; Optical apparatus and instruments for analyzing material, namely, electron probe micro analyzers, energy-dispersive X- ray fluorescence spectrometers, energy-dispersive X-ray spectrometers, X-ray fluorescence spectrometers; Detectors for analyzing material, namely, X-ray detectors not for medical use, electron dispersive detectors; Measuring or testing machines and instruments, namely, review systems for analyzing or measuring material, namely, wafer defect inspection instruments, pattern measuring instruments; Microscopy diffraction apparatus in the nature of lenses for microscopes; Diffraction apparatus for microscopy not for medical purposes; Containers for microscope slides; Precision instruments for manipulation and positioning of microscopic objects; Prisms; Laboratory equipment, namely, microscope slides; Microtomes; Betatrons; Bio-chips for research or scientific purposes; Electromagnetic coils; X-ray apparatus not for medical purposes; Scientific and technical apparatus, namely, optical Mirrors; Inspection mirrors; Electron tubes; Photoelectric sensors; Optical sensors; Power supplies; Power supplies for electron beam systems; Computer application software for metrology analysis, continues inspection, and series images storing, processing, analyzing and exporting for use in inspection and measurement of semiconductor materials, equipment parts, industrial components, liquid-suspended particles, foods and drugs, and biological samples, in particular for microscopic examination and quality control purposes |
| Pseudo Mark | TAIWAN ELECTRON MICROSCOPE INSTRUMENT CORPORATION |
| Indication of Colors claimed | The color(s) black and blue is/are claimed as a feature of the mark. |
| International Class | 009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus. |
| US Class Codes | 021, 023, 026, 036, 038 |
| Class Status Code | 6 - Active |
| Class Status Date | Tuesday, November 14, 2017 |
| Primary Code | 009 |
| First Use Anywhere Date | Thursday, March 3, 2016 |
| First Use In Commerce Date | Monday, June 4, 2018 |
| Party Name | Taiwan Electron Microscope Instrument Corporation |
| Party Type | 30 - Original Registrant |
| Legal Entity Type | 03 - Corporation |
| Address | Hsinchu 30078 TW |
| Party Name | Taiwan Electron Microscope Instrument Corporation |
| Party Type | 20 - Owner at Publication |
| Legal Entity Type | 03 - Corporation |
| Address | Hsinchu 30078 TW |
| Party Name | Taiwan Electron Microscope Instrument Corporation |
| Party Type | 10 - Original Applicant |
| Legal Entity Type | 03 - Corporation |
| Address | Hsinchu 30078 TW |
| Event Date | Event Description |
| Wednesday, December 28, 2022 | TEAS CHANGE OF CORRESPONDENCE RECEIVED |
| Wednesday, December 28, 2022 | TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS |
| Wednesday, December 28, 2022 | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED |
| Wednesday, December 28, 2022 | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED |
| Friday, December 23, 2022 | TEAS CHANGE OF CORRESPONDENCE RECEIVED |
| Friday, December 23, 2022 | TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS |
| Friday, December 23, 2022 | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED |
| Friday, December 23, 2022 | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED |
| Tuesday, December 31, 2019 | REGISTERED-PRINCIPAL REGISTER |
| Tuesday, November 26, 2019 | NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED |
| Monday, November 25, 2019 | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED |
| Tuesday, October 29, 2019 | STATEMENT OF USE PROCESSING COMPLETE |
| Wednesday, October 9, 2019 | USE AMENDMENT FILED |
| Saturday, October 26, 2019 | CASE ASSIGNED TO INTENT TO USE PARALEGAL |
| Wednesday, October 9, 2019 | TEAS STATEMENT OF USE RECEIVED |
| Tuesday, April 9, 2019 | NOA E-MAILED - SOU REQUIRED FROM APPLICANT |
| Tuesday, February 12, 2019 | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED |
| Tuesday, February 12, 2019 | PUBLISHED FOR OPPOSITION |
| Wednesday, January 23, 2019 | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED |
| Monday, January 7, 2019 | ASSIGNED TO LIE |
| Wednesday, December 12, 2018 | APPROVED FOR PUB - PRINCIPAL REGISTER |
| Wednesday, December 12, 2018 | ASSIGNED TO EXAMINER |
| Tuesday, December 11, 2018 | TEAS/EMAIL CORRESPONDENCE ENTERED |
| Monday, December 10, 2018 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| Monday, December 10, 2018 | TEAS REQUEST FOR RECONSIDERATION RECEIVED |
| Wednesday, July 11, 2018 | NOTIFICATION OF FINAL REFUSAL EMAILED |
| Wednesday, July 11, 2018 | FINAL REFUSAL E-MAILED |
| Wednesday, July 11, 2018 | FINAL REFUSAL WRITTEN |
| Wednesday, June 20, 2018 | TEAS/EMAIL CORRESPONDENCE ENTERED |
| Tuesday, June 19, 2018 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| Tuesday, June 19, 2018 | TEAS RESPONSE TO OFFICE ACTION RECEIVED |
| Friday, February 23, 2018 | NOTIFICATION OF NON-FINAL ACTION E-MAILED |
| Friday, February 23, 2018 | NON-FINAL ACTION E-MAILED |
| Friday, February 23, 2018 | NON-FINAL ACTION WRITTEN |
| Wednesday, February 14, 2018 | ASSIGNED TO EXAMINER |
| Wednesday, November 15, 2017 | NOTICE OF DESIGN SEARCH CODE E-MAILED |
| Tuesday, November 14, 2017 | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED |
| Tuesday, November 7, 2017 | NEW APPLICATION ENTERED |