REVONTIUM Trademark

Trademark Overview


On Tuesday, August 27, 2024, a trademark application was filed for REVONTIUM with the United States Patent and Trademark Office. The USPTO has given the REVONTIUM trademark a serial number of 79418464. The federal status of this trademark filing is FINAL REFUSAL - MAILED as of Tuesday, November 25, 2025. This trademark is owned by Malvern Panalytical B.V.. The REVONTIUM trademark is filed in the Computer & Software Products & Electrical & Scientific Products, Construction & Repair Services, and Computer & Software Services & Scientific Services categories with the following description:

Scientific and technological services, namely, scientific research in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; scientific services, namely, research and design in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; design and development of scientific and measuring apparatus and instruments, namely, X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; Industrial research services in the field of materials science, analytical chemistry, geology, mineralogy, and mate...

installation, maintenance and repair of X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; installation of X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; information, advisory and consultancy services...

Scientific apparatus and instruments, namely, X-ray fluorescence (XRF) spectrometers for measuring the elemental composition of materials; scientific instruments, namely, X-ray fluorescence (XRF) spectrometers for detecting the elemental composition of materials; Scientific apparatus and instruments, namely, spectrometers for laboratory use, X-ray fluorescence analysers, x-ray spectrometers for laboratory use; Scientific apparatus and instruments, namely, diffractometers for measuring and detecting the diffraction of waves including X-rays; Scientific apparatus and instruments, namely. X-ray diffractometers for measuring and detecting crystal structure, crystallinity, microstructural properties and crystalline phase identification; Scientific apparatus and instruments, namely, neutron activation analysers for analysing the elemental composition of a material including trace elements; Scientific apparatus and instruments, namely, pulsed fast and thermal neutron activation analysers for ...
revontium

General Information


Serial Number79418464
Word MarkREVONTIUM
Filing DateTuesday, August 27, 2024
Status645 - FINAL REFUSAL - MAILED
Status DateTuesday, November 25, 2025
Registration Number0000000
Registration DateNOT AVAILABLE
Mark Drawing4 - Illustration: Drawing with word(s) / letter(s) / number(s) in Block form
Published for Opposition DateNOT AVAILABLE

Trademark Statements


Goods and ServicesScientific and technological services, namely, scientific research in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; scientific services, namely, research and design in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; design and development of scientific and measuring apparatus and instruments, namely, X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; Industrial research services in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; Scientific services, namely, scientific analysis in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; analysis of materials, namely, analysis of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; Scientific laboratory services for analytical testing of semiconductor wafers, solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; Technological consulting services in the field of spectrometry and diffractometry; technological consulting services in the field of inductively coupled plasma spectroscopy; industrial analysis and research services in the field of spectrometry, diffractometry and inductively coupled plasma spectroscopy; design and development of X-ray apparatus, X-ray fluorescence analysers and spectrometers, X-ray analytical apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analysers, wafer analysers, X-ray tubes, elemental spectrometry apparatus and instruments, inductively coupled plasma spectroscopy apparatus and instruments; design and development of computer hardware and software; design and development of computer software; Programming of computer software for others; design and development of computer software in the field of spectrometry, diffractometry and inductively coupled plasma spectroscopy; Programming of computer software for others in the field of spectrometry, diffractometry and inductively coupled plasmas spectroscopy; leasing and rental of scientific and measuring apparatus and instruments; leasing and rental of scientific and measuring apparatus, namely X-ray fluorescence analysers and spectrometers, elemental spectrometry apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, namely, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes
Goods and Servicesinstallation, maintenance and repair of X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; installation of X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; information, advisory and consultancy services all relating to the aforesaid
Goods and ServicesScientific apparatus and instruments, namely, X-ray fluorescence (XRF) spectrometers for measuring the elemental composition of materials; scientific instruments, namely, X-ray fluorescence (XRF) spectrometers for detecting the elemental composition of materials; Scientific apparatus and instruments, namely, spectrometers for laboratory use, X-ray fluorescence analysers, x-ray spectrometers for laboratory use; Scientific apparatus and instruments, namely, diffractometers for measuring and detecting the diffraction of waves including X-rays; Scientific apparatus and instruments, namely. X-ray diffractometers for measuring and detecting crystal structure, crystallinity, microstructural properties and crystalline phase identification; Scientific apparatus and instruments, namely, neutron activation analysers for analysing the elemental composition of a material including trace elements; Scientific apparatus and instruments, namely, pulsed fast and thermal neutron activation analysers for analysing the elemental composition of a material by identifying and quantifying a large number of elements simultaneously; X-ray fluorescence analysers; X-ray spectrometers for laboratory use; X-ray detecting apparatus and instruments, namely, X-ray fluorescence (XRF) analyzers not for medical purposes; X-ray detectors, namely, X-ray fluorescence analyzers not for medical purposes; X-ray detectors, namely, X-ray fluorescence analyzers; X-ray measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray fluorescence (XRF) analyzers not for medical purposes; spectrometers for laboratory use; Electronic spectrophotometers for use in identifying and measuring colours; apparatus for mass spectrometry; X-ray photo electron spectroscopy analysers, not for medical use; elemental analysers, namely, neutron activation analysers, pulsed fast and thermal neutron activation analysers, and X-ray diffractometers; X-ray neutron activation analysers for analysing the elemental composition of a material including trace elements; X-ray pulsed fast and thermal neutron activation analysers for analysing the elemental composition of a material by identifying and quantifying a large number of elements simultaneously; Inductively coupled plasma spectroscopy apparatus and instruments, namely, instruments for the elemental analysis of samples by Optical Emission Spectrometry and Mass Spectrometry; X-ray analytical apparatus, namely, X-ray fluorescence analyzers; industrial X-ray apparatusnot for medical use; Microscopy diffraction apparatus, namely, X-ray Microdiffractometers; diffraction apparatus for microscopy, namely, X-ray Microdiffractometers; diffraction apparatus and instruments, namely, X-ray diffractometers; Spectrometers for laboratory use, namely, diffractometers; X-ray diffraction apparatus, namely, X-ray diffractometers, X-ray spectrometers for laboratory use, namely, x-ray diffractometers; X-ray fluorescence spectrometers, namely, x-ray fluorescence diffractometers; X-ray diffractometers; Semiconductor wafer analysers for analysing dimensional properties, surface characteristics, material and chemical composition, electrical properties, and defects of semiconductor wafers; X-ray imaging detectors, namely, instruments used to capture the X-ray photons that pass through an object and convert them into an image; X-ray diffraction instruments, namely X-ray diffraction meters for the compound semiconductor industry; X-ray fluorescence wafer and disc analysers for analysing dimensional properties, surface characteristics, material and chemical composition, electrical properties, and defects; automated spectroscopes, namely, ellipsometers; X-ray fluorescence wafer and disc analysers for analysing film thickness, composition and density for the silicon semiconductor industry; Automated spectroscopes, namely, ellipsometers for the silicon semiconductor industry; X-ray measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray Fluorescence (XRF) Spectrometers, X-ray Diffractometers (XRD), and X-ray Spectrometers; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, namely, X-ray fluorescence spectrometers, x-ray tubes, other than for medical purposes; photon counting X-ray detectors, namely, direct conversion detectors that measure the energy and position of every individual X-ray photon that hits it; X-ray tubes, not for medical purposes; analytical, process control and measuring apparatus, namely, spectrometers for laboratory use, X-ray fluorescence analysers; analytical, process control and measuring apparatus, including spectrometers for laboratory use, X-ray fluorescence analysers for cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industries; analytical, process control and measuring apparatus, including spectrometers for laboratory use, x-ray fluorescence analysers for research and development institutions; metrology tools, namely, spectrometers for laboratory use, X-ray fluorescence analysers; Downloadable computer software for controlling and operating measuring instruments and for processing and analyzing data in the field of materials characterization; Downloadable computer software for analysing the elemental composition of a material including trace elements, crystal structure, crystallinity, microstructural properties and crystalline phase identification; Downloadable computer software for the determination of chemical composition in the field of spectrometry; downloadable computer software for [specify the function of the software in relation to spectrometry] in the field of spectrometry; Recorded computer software for [specify the function of the software in relation to spectrometry] in the field of spectrometry; downloadable computer software for [specify the function of the software operating diffractometers and reviewing and analyzing diffractometry data in the field of diffractometry;; Recorded computer software for operating diffractometers and reviewing and analyzing diffractometry data in the field of diffractometry; Downloadable computer software for operating x-ray diffractometers and reviewing and analyzing data in the field of x-ray diffraction; Computer hardware relating to X-ray diffraction and X-ray diffraction apparatus; Downloadable computer software for operation of x-ray fluorescence analyzers and reviewing and analyzing x-ray fluorescence data in the field of x-ray fluorescence analysis; Recorded computer software for operation of x-ray fluorescence analyzers and reviewing and analyzing x-ray fluorescence data in the field of x-ray fluorescence analysis; Downloadable computer software for determining X-ray intensities; Recorded computer software for determining X-ray intensities; Downloadable computer software for operating and controlling x-ray apparatuses in the field of X-ray apparatuses; Downloadable computer software for performing X-ray diffraction analysis; Recorded computer software for performing x-ray diffraction analysis; Downloadable computer software for determining the thickness of semiconductor wafer layer samples; Recorded computer software for determining the thickness of semiconductor wafer layer samples; Downloadable computer software for determining chemical compositions; Recorded computer software for determining chemical compositions; Downloadable computer software for conducting standardless analysis of samples of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; Recorded computer software for conducting standardless analysis of samples of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement

Classification Information


International Class009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
US Class Codes021, 023, 026, 036, 038
Class Status Code6 - Active
Class Status DateThursday, March 6, 2025
Primary Code009
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

International Class037 - Building construction; repair; installation services.
US Class Codes100, 103, 106
Class Status Code6 - Active
Class Status DateThursday, March 6, 2025
Primary Code037
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

International Class042 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software.
US Class Codes100, 101
Class Status Code6 - Active
Class Status DateThursday, March 6, 2025
Primary Code042
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

Trademark Owner History


Party NameMalvern Panalytical B.V.
Party Type10 - Original Applicant
Legal Entity Type99 - Other
AddressNL

Trademark Events


Event DateEvent Description
Thursday, March 6, 2025SN ASSIGNED FOR SECT 66A APPL FROM IB
Sunday, March 9, 2025NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
Sunday, March 9, 2025APPLICATION FILING RECEIPT MAILED
Monday, March 10, 2025ASSIGNED TO EXAMINER
Tuesday, March 18, 2025NON-FINAL ACTION WRITTEN
Wednesday, March 19, 2025NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW
Friday, May 2, 2025REFUSAL PROCESSED BY MPU
Saturday, May 3, 2025NON-FINAL ACTION MAILED - REFUSAL SENT TO IB
Friday, May 16, 2025NEW REPRESENTATIVE AT IB RECEIVED
Saturday, May 24, 2025REFUSAL PROCESSED BY IB
Tuesday, September 2, 2025TEAS CHANGE OF OWNER ADDRESS RECEIVED
Tuesday, September 2, 2025APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED
Tuesday, September 2, 2025TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED
Tuesday, September 2, 2025ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED
Tuesday, September 2, 2025TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS
Monday, October 27, 2025TEAS RESPONSE TO OFFICE ACTION RECEIVED
Monday, October 27, 2025CORRESPONDENCE RECEIVED IN LAW OFFICE
Monday, October 27, 2025TEAS/EMAIL CORRESPONDENCE ENTERED
Tuesday, November 25, 2025FINAL REFUSAL WRITTEN
Tuesday, November 25, 2025FINAL REFUSAL E-MAILED
Tuesday, November 25, 2025NOTIFICATION OF FINAL REFUSAL EMAILED