PIXIRAD Trademark

Trademark Overview


On Monday, September 30, 2019, a trademark application was filed for PIXIRAD with the United States Patent and Trademark Office. The USPTO has given the PIXIRAD trademark a serial number of 79273398. The federal status of this trademark filing is REGISTERED as of Tuesday, September 22, 2020. This trademark is owned by Malvern Panalytical B.V.. The PIXIRAD trademark is filed in the Computer & Software Products & Electrical & Scientific Products category with the following description:

Scientific, measuring and detecting apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; X-ray detectors not for medical purposes; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer a...
pixirad

General Information


Serial Number79273398
Word MarkPIXIRAD
Filing DateMonday, September 30, 2019
Status700 - REGISTERED
Status DateTuesday, September 22, 2020
Registration Number6155788
Registration DateTuesday, September 22, 2020
Mark Drawing4 - Illustration: Drawing with word(s) / letter(s) / number(s) in Block form
Published for Opposition DateTuesday, July 7, 2020

Trademark Statements


Goods and ServicesScientific, measuring and detecting apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; X-ray detectors not for medical purposes; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; X-ray fluorescence wafer and disc analysers, and automated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry, for analysing film thickness, composition and density; diffraction apparatus for microscopy; diffraction apparatus and instruments; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray tubes, not for medical purposes; downloadable or recorded computer software for use in relation to spectrometry; downloadable or recorded computer software for analysis purposes; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; component parts and fittings for all the aforesaid goods

Classification Information


International Class009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
US Class Codes021, 023, 026, 036, 038
Class Status Code6 - Active
Class Status DateFriday, December 6, 2019
Primary Code009
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

Trademark Owner History


Party NameMalvern Panalytical B.V.
Party Type30 - Original Registrant
Legal Entity Type99 - Other
AddressNL

Party NameMalvern Panalytical B.V.
Party Type20 - Owner at Publication
Legal Entity Type99 - Other
AddressNL

Party NameMalvern Panalytical B.V.
Party Type10 - Original Applicant
Legal Entity Type99 - Other
AddressNL

Trademark Events


Event DateEvent Description
Thursday, December 5, 2019SN ASSIGNED FOR SECT 66A APPL FROM IB
Friday, December 6, 2019NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
Tuesday, December 10, 2019APPLICATION FILING RECEIPT MAILED
Thursday, January 2, 2020ASSIGNED TO EXAMINER
Thursday, January 2, 2020NON-FINAL ACTION WRITTEN
Friday, January 3, 2020NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW
Monday, January 27, 2020REFUSAL PROCESSED BY MPU
Monday, January 27, 2020NON-FINAL ACTION MAILED - REFUSAL SENT TO IB
Saturday, February 15, 2020REFUSAL PROCESSED BY IB
Monday, May 4, 2020TEAS RESPONSE TO OFFICE ACTION RECEIVED
Monday, May 4, 2020CORRESPONDENCE RECEIVED IN LAW OFFICE
Monday, May 4, 2020TEAS/EMAIL CORRESPONDENCE ENTERED
Wednesday, June 3, 2020APPROVED FOR PUB - PRINCIPAL REGISTER
Wednesday, June 17, 2020NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
Tuesday, July 7, 2020PUBLISHED FOR OPPOSITION
Tuesday, July 7, 2020OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
Tuesday, September 22, 2020REGISTERED-PRINCIPAL REGISTER
Tuesday, December 22, 2020FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB
Wednesday, January 6, 2021FINAL DISPOSITION PROCESSED
Wednesday, January 6, 2021FINAL DISPOSITION NOTICE SENT TO IB
Saturday, January 23, 2021FINAL DECISION TRANSACTION PROCESSED BY IB
Friday, May 16, 2025NEW REPRESENTATIVE AT IB RECEIVED
Monday, September 22, 2025COURTESY REMINDER - SEC. 71 (6-YR) E-MAILED