| Serial Number | 76182067 |
| Word Mark | NLINE |
| Filing Date | Thursday, December 14, 2000 |
| Status | 710 - CANCELLED - SECTION 8 |
| Status Date | Friday, September 9, 2011 |
| Registration Number | 2925556 |
| Registration Date | Tuesday, February 8, 2005 |
| Mark Drawing | 1000 - Typeset: Word(s) / letter(s) / number(s) |
| Published for Opposition Date | Tuesday, October 22, 2002 |
| Goods and Services | Inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes, for use in the manufacturing and testing of semiconductors |
| Goods and Services | Installation, maintenance and repair of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes |
| Goods and Services | Custom manufacture and design of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes |
| Goods and Services | On-site and off-site inspection services for the semiconductor industry, namely wafer inspection, reticle inspection, defect detection, defect review, defect classification, nanotopography measurement, wafer flatness measurement, surface profiling, film thickness measurement, critical dimension measurement, and microscopy; and leasing and consultation of inspection and test equipment for the semiconductor industry, namely wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes |
| International Class | 009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus. |
| US Class Codes | 021, 023, 026, 036, 038 |
| Class Status Code | 2 - Sec. 8 - Entire Registration |
| Class Status Date | Friday, September 9, 2011 |
| Primary Code | 009 |
| First Use Anywhere Date | Saturday, July 1, 2000 |
| First Use In Commerce Date | Saturday, July 1, 2000 |
| International Class | 037 - Building construction; repair; installation services. |
| US Class Codes | 100, 103, 106 |
| Class Status Code | 2 - Sec. 8 - Entire Registration |
| Class Status Date | Friday, September 9, 2011 |
| Primary Code | 037 |
| First Use Anywhere Date | Saturday, July 1, 2000 |
| First Use In Commerce Date | Saturday, July 1, 2000 |
| International Class | 040 - Treatment of materials. |
| US Class Codes | 100, 103, 106 |
| Class Status Code | 2 - Sec. 8 - Entire Registration |
| Class Status Date | Friday, September 9, 2011 |
| Primary Code | 040 |
| First Use Anywhere Date | Saturday, July 1, 2000 |
| First Use In Commerce Date | Saturday, July 1, 2000 |
| International Class | 042 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software. |
| US Class Codes | 100, 101 |
| Class Status Code | 2 - Sec. 8 - Entire Registration |
| Class Status Date | Friday, September 9, 2011 |
| Primary Code | 042 |
| First Use Anywhere Date | Saturday, July 1, 2000 |
| First Use In Commerce Date | Saturday, July 1, 2000 |
| Party Name | nLine Corporation |
| Party Type | 30 - Original Registrant |
| Legal Entity Type | 03 - Corporation |
| Address | Austin, TX 78744 |
| Party Name | nLine Corporation |
| Party Type | 20 - Owner at Publication |
| Legal Entity Type | 03 - Corporation |
| Address | Austin, TX 78744 |
| Party Name | nLine Corporation |
| Party Type | 10 - Original Applicant |
| Legal Entity Type | 03 - Corporation |
| Address | Austin, TX 78744 |
| Event Date | Event Description |
| Friday, September 9, 2011 | CANCELLED SEC. 8 (6-YR) |
| Tuesday, February 8, 2005 | REGISTERED-PRINCIPAL REGISTER |
| Friday, December 10, 2004 | LAW OFFICE REGISTRATION REVIEW COMPLETED |
| Monday, December 6, 2004 | ASSIGNED TO LIE |
| Sunday, November 28, 2004 | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED |
| Monday, November 8, 2004 | STATEMENT OF USE PROCESSING COMPLETE |
| Friday, October 15, 2004 | USE AMENDMENT FILED |
| Friday, October 15, 2004 | PAPER RECEIVED |
| Tuesday, August 31, 2004 | CASE FILE IN TICRS |
| Tuesday, May 11, 2004 | FAX RECEIVED |
| Tuesday, May 4, 2004 | NOA MAILED - SOU REQUIRED FROM APPLICANT |
| Tuesday, October 22, 2002 | PUBLISHED FOR OPPOSITION |
| Wednesday, October 2, 2002 | NOTICE OF PUBLICATION |
| Thursday, July 18, 2002 | APPROVED FOR PUB - PRINCIPAL REGISTER |
| Friday, July 5, 2002 | ASSIGNED TO EXAMINER |
| Tuesday, March 5, 2002 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| Monday, March 25, 2002 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| Monday, March 25, 2002 | PAPER RECEIVED |
| Monday, September 24, 2001 | FINAL REFUSAL MAILED |
| Monday, June 11, 2001 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| Thursday, March 22, 2001 | NON-FINAL ACTION MAILED |
| Tuesday, March 20, 2001 | ASSIGNED TO EXAMINER |