LASERTEC Trademark

Trademark Overview

On Thursday, March 3, 2016, a trademark application was filed for LASERTEC with the United States Patent and Trademark Office. The USPTO has given the LASERTEC trademark a serial number of 79187390. The federal status of this trademark filing is REGISTERED as of Tuesday, June 23, 2020. This trademark is owned by LASERTEC CORPORATION. The LASERTEC trademark is filed in the Computer & Software Products & Electrical & Scientific Products category with the following description:

Confocal scanning microscopes; optical inspection apparatus for industrial use for inspection of semiconductor materials, namely, photomasks and reticles silicon wafers and mask blanks in the nature of blank optical plate; phase-shift mask measurement system for photomask comprising optical measurement unit in the nature of optical measuring sensors, mask stages in the nature of optical stages for reflection and transmission measurements of flat substrates, electronic controller and computer; wafer inspection system comprised of optical inspection apparatus, wafer stages in the nature of stages for semiconductor wafers, electronic controller, and computer; wafer measurement system comprised of optical measurement apparatus, wafer stages in the nature of stages for semiconductor wafers, electronic controller and computer; substrate inspection system comprised of optical inspection apparatus, substrate stage in the nature of optical stages for reflection measurement of flat substrates, e...
lasertec

General Information

Serial Number79187390
Word MarkLASERTEC
Filing DateThursday, March 3, 2016
Status700 - REGISTERED
Status DateTuesday, June 23, 2020
Registration Number6082221
Registration DateTuesday, June 23, 2020
Mark Drawing5000 - Drawing with word(s) / letter(s) / number(s) in Stylized form
Published for Opposition DateTuesday, April 7, 2020

Trademark Statements

Indication of Colors claimedColor is not claimed as a feature of the mark.
Goods and ServicesConfocal scanning microscopes; optical inspection apparatus for industrial use for inspection of semiconductor materials, namely, photomasks and reticles silicon wafers and mask blanks in the nature of blank optical plate; phase-shift mask measurement system for photomask comprising optical measurement unit in the nature of optical measuring sensors, mask stages in the nature of optical stages for reflection and transmission measurements of flat substrates, electronic controller and computer; wafer inspection system comprised of optical inspection apparatus, wafer stages in the nature of stages for semiconductor wafers, electronic controller, and computer; wafer measurement system comprised of optical measurement apparatus, wafer stages in the nature of stages for semiconductor wafers, electronic controller and computer; substrate inspection system comprised of optical inspection apparatus, substrate stage in the nature of optical stages for reflection measurement of flat substrates, electronic controller, and computer; PV cell measurement system comprised of solar simulator, measurement unit in the nature of electronic sensors for measuring solar radiation, cell stages in the nature of stages for measurement of flat substrates, electronic controller and computer; coating thickness scanning system for lithium ion batteries comprised of coating thickness measuring gauge ; pellicle inspection apparatus in the nature of an optical inspection apparatus that inspects a pellicle film of a mask provided with a pellicle and used in EUV lithography
Pseudo MarkLASER TEC; LASER TECH

Classification Information

International Class009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
US Class Codes021, 023, 026, 036, 038
Class Status Code6 - Active
Class Status DateMonday, October 3, 2016
Primary Code009
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

Trademark Owner History

Party NameLASERTEC CORPORATION
Party Type30 - Original Registrant
Legal Entity Type03 - Corporation
AddressKanagawa-ken 222-0033
JP
Party NameLASERTEC CORPORATION
Party Type20 - Owner at Publication
Legal Entity Type03 - Corporation
AddressKanagawa-ken 222-0033
JP
Party NameLASERTEC CORPORATION
Party Type10 - Original Applicant
Legal Entity Type03 - Corporation
AddressKanagawa-ken 222-0033
JP

Trademark Events

Event DateEvent Description
Sunday, November 1, 2020FINAL DECISION TRANSACTION PROCESSED BY IB
Friday, October 9, 2020FINAL DISPOSITION NOTICE SENT TO IB
Thursday, October 8, 2020FINAL DISPOSITION PROCESSED
Wednesday, September 23, 2020FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB
Friday, August 14, 2020NOTIFICATION PROCESSED BY IB
Tuesday, June 23, 2020REGISTERED-PRINCIPAL REGISTER
Tuesday, April 7, 2020OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
Tuesday, April 7, 2020PUBLISHED FOR OPPOSITION
Wednesday, March 18, 2020NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB
Wednesday, March 18, 2020NOTICE OF START OF OPPOSITION PERIOD CREATED, TO BE SENT TO IB
Wednesday, March 18, 2020NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
Saturday, February 29, 2020EXPARTE APPEAL TERMINATED
Saturday, February 29, 2020APPROVED FOR PUB - PRINCIPAL REGISTER
Saturday, February 29, 2020EXAMINER'S AMENDMENT ENTERED
Saturday, February 29, 2020NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED
Saturday, February 29, 2020EXAMINERS AMENDMENT E-MAILED
Saturday, February 29, 2020EXAMINERS AMENDMENT -WRITTEN
Monday, January 27, 2020JURISDICTION RESTORED TO EXAMINING ATTORNEY
Thursday, September 19, 2019TEAS CHANGE OF CORRESPONDENCE RECEIVED
Monday, January 7, 2019NOTIFICATION OF ACTION DENYING REQ FOR RECON E-MAILED
Monday, January 7, 2019ACTION DENYING REQ FOR RECON E-MAILED
Monday, January 7, 2019ACTION CONTINUING FINAL - COMPLETED
Tuesday, November 27, 2018JURISDICTION RESTORED TO EXAMINING ATTORNEY
Monday, September 10, 2018NOTIFICATION OF ACTION DENYING REQ FOR RECON E-MAILED
Monday, September 10, 2018ACTION DENYING REQ FOR RECON E-MAILED
Monday, September 10, 2018ACTION CONTINUING FINAL - COMPLETED
Wednesday, July 25, 2018JURISDICTION RESTORED TO EXAMINING ATTORNEY
Friday, November 24, 2017NOTIFICATION OF POSSIBLE OPPOSITION - PROCESSED BY IB
Wednesday, November 8, 2017NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB
Wednesday, November 8, 2017NOTIFICATION OF POSSIBLE OPPOSITION CREATED, TO BE SENT TO IB
Tuesday, July 18, 2017NOTIFICATION OF ACTION DENYING REQ FOR RECON E-MAILED
Tuesday, July 18, 2017ACTION DENYING REQ FOR RECON E-MAILED
Tuesday, July 18, 2017ACTION CONTINUING FINAL - COMPLETED
Tuesday, July 18, 2017TEAS/EMAIL CORRESPONDENCE ENTERED
Tuesday, July 18, 2017CORRESPONDENCE RECEIVED IN LAW OFFICE
Tuesday, July 18, 2017ASSIGNED TO LIE
Thursday, June 29, 2017TEAS REQUEST FOR RECONSIDERATION RECEIVED
Thursday, June 29, 2017EX PARTE APPEAL-INSTITUTED
Thursday, June 29, 2017JURISDICTION RESTORED TO EXAMINING ATTORNEY
Thursday, June 29, 2017EXPARTE APPEAL RECEIVED AT TTAB
Thursday, December 29, 2016NOTIFICATION OF FINAL REFUSAL EMAILED
Thursday, December 29, 2016FINAL REFUSAL E-MAILED
Thursday, December 29, 2016FINAL REFUSAL WRITTEN
Friday, October 7, 2016NOTICE OF REINSTATEMENT MAILED
Monday, October 3, 2016REINSTATED
Saturday, August 27, 2016NOTIFICATION OF EFFECT OF CANCELLATION OF INTL REG E-MAILED
Friday, August 26, 2016DEATH OF INTERNATIONAL REGISTRATION
Friday, August 12, 2016ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED
Friday, August 12, 2016TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED
Friday, August 12, 2016TEAS/EMAIL CORRESPONDENCE ENTERED
Friday, August 12, 2016CORRESPONDENCE RECEIVED IN LAW OFFICE
Friday, August 12, 2016TEAS RESPONSE TO OFFICE ACTION RECEIVED
Friday, July 22, 2016REFUSAL PROCESSED BY IB
Monday, June 20, 2016NON-FINAL ACTION MAILED - REFUSAL SENT TO IB
Monday, June 20, 2016REFUSAL PROCESSED BY MPU
Saturday, June 18, 2016NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW
Friday, June 17, 2016NON-FINAL ACTION WRITTEN
Thursday, June 16, 2016ASSIGNED TO EXAMINER
Tuesday, June 14, 2016APPLICATION FILING RECEIPT MAILED
Wednesday, June 8, 2016NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM
Thursday, June 2, 2016LIMITATION FROM ORIGINAL APPLICATION ENTERED
Thursday, June 2, 2016SN ASSIGNED FOR SECT 66A SUBSEQ DESIG FROM IB

Related Keywords

lasertec optical stages inspection nature measurement wafer apparatus system wafers electronic