XUVM
Scientific, electrical, optical monitoring and measuring instruments namely, coating thickness measurement instruments,[ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments;] instruments for measuring thickness of coatings, alloy compositions, material analysis,[ porosity, electrical conductivity,] ferrite content,[ micro-hardness, ]and other properties of coatings and layers;[ magneto,- opto,- and electronic data recording medi...
Cancelled · September 25, 1998 · 75559728 ·