Specimen enclosures used to image, analyze or measure samples in microscopes and electron microscopes as well as their parts and fittings; [ microscopes and electron microscopes and their parts and fittings; electronic measuring and testing machines and instruments used to image, analyze or measure samples in microscopes; optical detectors, X-ray detectors, secondary electron detectors, backscattered electron detectors and light guides for imaging, analyzing or measuring samples in microscope...