LABORATORY AND MANUFACTURING EQUIPMENT FOR USE WITH SEMICONDUCTOR ANALYSIS, NAMELY, MICROSCOPES, IMAGE ANALYZERS AND STRUCTURAL PARTS THEREFOR; SEMICONDUCTOR INTEGRATED CIRCUIT INSPECTION EQUIPMENT COMPRISED OF COLLECTION OPTICS, PHOTONS SENSORS, FIBERS OPTICS, PHOTONS SENSORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; SEMICONDUCTOR; WAFER INSPECTION EQUIPMENT COMPRISED OF COLLECTION OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; SEMICONDUCTOR INTEGRATED CIRCUIT TESTING EQUIPMENT COMPRIS...