UNISERS
Recorded software for the analysis of semiconductor wafers; Recorded software for the detection and analysis of defects on semiconductor wafers; Recorded software for the detection and analysis of nanoparticles on surfaces and in fluids; test equipment for semiconductor wafers and semiconductors, namely, semiconductor wafer and semiconductor testing apparatus; surface inspection equipment, namely, surface optical scanner; measuring equipment and instruments, namely, optical microscopy measuri...
Registered · May 30, 2022 · 79356088 ·