TRANSLARITY
Probes for testing semiconductors; Probes for testing integrated circuits; Computer software for use in operating semiconductor testing machines; semiconductor inspection and testing equipment, namely, semiconductor wafers, reticles and photomasks; semiconductor burn-in test equipment, namely, probes for testing semiconductors; semiconductor testing machines; equipment for detecting and measuring failures in the manufacturing processes of semiconductors, semiconductor elements and liquid crystal
Cancelled · August 21, 2014 · 86372909 ·
