TIDEX
X-ray-based test equipment for measuring the Total Ionizing Dose (TID) effect corresponding to the accumulated damage in a semiconductor device caused by prolonged exposure to ionizing radiation such as X-rays, gamma rays, protons, or electrons, in spacecraft electronics, satellites, aircraft and spacecraft electronic systems, nuclear instrumentation, and medical imaging and dosimetry systems
Pending · July 8, 2025 · 99272380 ·