Apparatus for inspecting semiconductors; apparatus for analyzing chemical components of organic and inorganic materials; apparatus for analyzing the substance structure of organic and inorganic materials; measuring and analyzing apparatuses, namely X-ray fluorescence spectrometers, X-ray absorption fine structure analyzing apparatus, X-ray diffractmeters, mass spectrometers, spectrophotometers, magnetic resonance apparatus, chromatograph apparatus; electron microscopes; non-medical industrial...