SPECS
components and systems for surface analysis, in particular surface analyzers for electron spectroscopy (XPS, UPS, AES, ISS), sputtered neutrals and secondary ion mass spectroscopy (SIMS, SNMS), laser microprobe mass analysis low energy electron diffraction (LEED), electron energy loss spectroscopy (EELS) and relection high energy electron diffraction, secondary electron detectors, ion mass spectrometers, sputtered neutrals and secondary ion mass spectrometers, photo-electron spectrometers, io...
Abandoned · September 12, 1994 · 74572157 ·