X-RAY MICROANALYSIS SYSTEMS, CONSISTING OF X-RAY DETECTORS, COMPUTER HARDWARE AND COMPUTER SOFTWARE THEREFORE, FOR DETECTING, MEASURING AND EVALUATING X-RAYS, ELECTRON IMAGES AND SIGNALS EMITTED AND PROJECTED BY SAMPLES WHEN STRUCK BY THE BEAM OF AN ELECTRON MICROSCOPE, NOT FOR USE IN THE MEDICAL FIELD; PARTICLE ANALYZERS; SIGNAL PROCESSORS; RADIATION ANALYZERS; LIGHT ELEMENT DETECTORS; AND X-RAY ANALYZERS