Scientific, measuring and analytical apparatus for materials characterization, namely, x-rays, x-ray tubes, x-ray cameras, diffractometers, reflectometers, refractometers, x-ray typography apparatus and instruments, x-ray scattering apparatus and instruments, and spectroscopes for scientific use; x-ray metrology apparatus for semi-conductors and materials, namely, thin films, metallic thin films, multi-layers, ceramics, superconductors; apparatus and instruments for analyzing and testing thin...