downloadable and recorded computer software for controlling nanotechnology instruments, namely, microscopes, measuring apparatus and measuring instruments, namely, atomic force microscopes (AFM)

ELECTRONIC SCANNERS FOR MEASURING SURFACE COVERAGE OF PRINTING PLATES FOR PRINTING MACHINES

SORTING MACHINES HAVING DATAREADING DEVICES FOR SCANNING A SUCCESSION OF ARTICLES SUPPLIED THERETO AND FOR SORTING AND DISTRIBUTING THE ARTICLES ACCORDING TO DATA CARRIED BY EACH ARTICLE

Pre-Recorded Computer Programs for Use in Analyzing Color Images and Computing Optimum Tone Reproduction and Gray Balance Settings for Electronic Scanners