Providing instruction for the use of machines for inspecting and for measuring, quality, uniformity and contamination of semiconductors, semiconductor wafers, semiconductor devices, as well as components and substrates of all of the foregoing; providing instruction for the use of computer software for operating all of the foregoing machines

Sensor products used to detect signals from machinery and industrial systems

Electronic instruments, namely, computer hardware, software and calibration devices sold as a unit for use in the rapid surface electric and topographic metrology inspection and calibration of semiconductor and wafer process examination and for quality control