Electronic apparatus for non-destructive testing and for detecting longitudinal and transversal, external and internal defects in conductive and metal materials; probes, sensors, test heads and exploring coils for the above mentioned apparatus; electronic data processing equipment, namely, computers and data processors for controlling the above-mentioned apparatus, and for evaluating information therefrom; software and programs recorded on data carriers for controlling the above-mentioned app...

Electronic apparatus for non-destructive testing and for detecting longitudinal and transversal, external and internal defects in conductive and metal materials; probes, sensors, test heads and exploring coils for the above mentioned apparatus; electronic data processing equipment, namely, computers and data processors for controlling the above-mentioned apparatus, and for evaluating information therefrom; software and programs recorded on data carriers for controlling the above-mentioned app...