Testing equipment for high speed electronics and optical communications; components and test measurement equipment for high speed electronics, including serial data electronics, in the nature of active components, namely linear amplifiers, driver amplifiers, limiting amplifiers, delay lines, and sampler circuitry; passive components, namely bias tees, low pass filters, power dividers, pick-off tees, attenuators, dc blocks, impulse forming networks, baluns and transformers; signal generation m...

Laser pattern generation device that reads computer data, translates the data into a drawing of a part to be manufactured and projects the pattern of the part onto a work surface