Metrology apparatus for semiconductor manufacturing, namely, in-situ units for measuring thin film stress on semiconductor wafers during transport into and out of process chambers of physical vapor deposition (PVD) and chemical vapor deposition (CVD) tools; downloadable and recorded computer software for controlling, operating, and analyzing measurements from such metrology apparatus.

Computer software for managing, editing, sharing, and storing digital photographs and videos; downloadable software in the nature of mobile applications for managing, editing, sharing, and storing digital photographs and videos