Computer programs for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; Computer programs and computer software for detecting defects in the image pattern and design layout pattern of electronic circuits by optical microscopes, electron beam microscopes or scanning electron microscopes; data processing programs for detecting defects in the image pattern and design layout p...

Scientific and technological services, namely, analysis of defects in the image pattern and design layout pattern of electronic circuits, semiconductors, semiconductor wafers, integrated circuits, printed circuit boards, semiconductor packaging, LCD panels and solar panels by optical microscopes, electron beam microscopes or scanning electron microscopes; computer programming and software design for the analysis of defects in the image pattern and design layout pattern of electronic circuits,...