Electronic instruments for measuring position for non-medical purposes; displacement monitoring devices, namely, displacement transducers; capacitance displacement monitoring devices, namely, capacitance displacement transducers; electrical controllers; digital read-out units, computer display modules and interfaces therefor; interferometers; scanning probe microscopy apparatus; and replacement parts for all of the aforesaid goods

displacement monitoring devices, namely displacement transducers; capacitance displacement monitoring devices, namely capacitance displacement transducers; electrical controllers; read-out and computer display modules and interfaces therefor; interferometers; scanning probe microscopy apparatus; and parts therefor for all of the aforesaid goods

sensors for scanning force microscopy; tips in the nature of micromachined protrusions on the end of flexible cantilevers for measuring the profile of a surface