Scientific apparatus and instruments, namely atomic force microscope probes and scanning probe microscopes; microscope probes; calibration standards, namely devices consisting of a 2-dimensional lattice of inverted square pyramids designed to calibrate atomic force microscopes, scanning probe microscopes and scanning tunneling microscopes; microscopes and microscope probes for use in the field of atomic force microscopy, scanning tunneling microscopy, and near-field optical microscopy; scanni...