Electronic test and measurement apparatus, namely, current sources, voltage sources, combination current and voltage sources, Hall effect-based measurement instruments and controllers for use in testing and measuring semiconductor materials and devices; other scientific test and measurement apparatus for use in the field of electronic materials or device analysis and characterization for use in testing and measuring semiconductor and magnetic materials and devices

Electromagnet-based measurement platforms in the nature of temperature-controlled sample holders and their accessories for use in testing and measuring semiconductor and magnetic materials and devices

Electronic test and measurement apparatus, namely, current sources, voltage sources, combination current and voltage sources, Hall effect-based measurement instruments and controllers for use in testing and measuring semiconductor materials and devices; other scientific test and measurement apparatus for use in the field of electronic materials or device analysis and characterization for use in testing and measuring semiconductor and magnetic materials and devices

Electromagnet-based measurement platforms in the nature of temperature-controlled sample holders and their accessories for use in testing and measuring semiconductor and magnetic materials and devices