electronic systems comprised of electronic circuits and electronic components, namely, space transformers, interposers, probe elements, and small resilient contact elements and probe cards

RF Test probes and components used with a Time Domain Reflectometer or frequency domain Network Analyzer

RF test probes and components, namely, balanced odd mode 100ohm probes that are convertible to 50 ohm time domain reflection probes, micro manipulator adaptors, macro-lens, SMA wrench containing probe pitch setting calibration holes, hand-held probe sleeve adapters, and cable routing sleeve, for use in measuring impedance through a circuit, discontinuities that cause reflections and the distance of the discontinuities