scientific instruments, namely, contacting instruments for use in inspection and measurement of sheet resistance of a conducting sample through the use of a contacting probe or pin arrangement; scientific instruments, namely, non-contacting instruments for use in inspection and measurement of sheet resistance of a conducting sample through the use of eddy currents in a non-contacting arrangement

Electro-optical instruments for use in inspection and measurement of industrial components

Electro-optical instruments for use in inspection and measurement of industrial components

Optical thin-film measuring instruments, namely, systems comprised of computers, spectrometers, lamps, fiber optic cables and lenses, sold as a unit, for measuring the thickness, deposition rate, and/or refractive index of dielectric, semiconductor, and metal thin-films

Systems comprised of computers, spectrometers, halogen lamps and fiber optic cables and cable lens, sold as a unit, for measuring film thickness, deposition rate, or wavelength-dependent optical constants