SEMICONDUCTOR MEASURING AND CONTROL DEVICES, INCLUDING COMPUTER HARDWARE AND SOFTWARE COMPONENTS, FOR USE IN MEASURING AND CONTROLLING INDIVIDUAL SEMICONDUCTOR WAFERS, INCLUDING THE REFLECTIVITY OF GROWING WAFER SURFACES AND WAFER SURFACE TEMPERATURES; MECHANICAL TOOLS AND INSTRUMENTS FOR THE MANUFACTURE OF SEMICONDUCTORS, NAMELY, CHEMICAL VAPOR DEPOSITION REACTORS, AND COMPUTER HARDWARE AND SOFTWARE FOR USE IN THE MANUFACTURE OF SEMICONDUCTORS

Semiconductor measuring and control devices, including computer hardware and software components, for use in measuring and controlling individual semiconductor wafers, including the reflectivity of growing wafer surfaces and wafer surface temperatures; mechanical tools and instruments for the manufacture of semiconductors, namely, chemical vapor deposition reactors, and computer hardware and software for use in the manufacture of semiconductors