surface measurement instrumentation, namely stylus based surface profilers, four-point resistivity probes, atomic force profilers, and atomic force microscopes

surface measurement instrumentation; namely, stylus based surface profilers, four-point resistivity probes, atomic force profilers, and atomic force microscopes

SURFACE MEASUREMENT INSTRUMENT OF THE TYPE WHEREIN A STYLUS RIDES OVER THE SAMPLE SURFACE AND THE STYLUS MOVEMENT IS AMPLIFIED AND RECORDED

Surface Profile Measuring System Comprising an Instrument Calibrator Block, Scanning Head, Control Console and Printer

Surface measurement equipment comprised of stylus based surface profilers, and probes and computer software therefor