MEASURING AND ANALYTICAL APPARATUS AND INSTRUMENTS AND MATERIALS CHARACTERIZATION AND MATERIALS TESTING APPARATUS AND INSTRUMENTS, NAMELY, APPARATUS AND INSTRUMENTS FOR ANALYZING AND TESTING THIN FILMS, METALLIC THIN FILMS, MULTI LAYERS, CERAMICS, SUPER CONDUCTORS AND SEMI-CONDUCTORS; POWDER, SINGLE CRYSTAL AND HIGH RESOLUTION DIFFRACTION MEASURING TOOLS; X-RAY APPARATUS AND INSTRUMENTS, NAMELY, X-RAY TUBES, X-RAY CAMERAS, X-RAY DETECTORS, DIFFRACTOMETERS, REFLECTOMETERS, AND X-RAY TOPOGRAPHY...