ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETER DATA

variable retarder in an ellipsometer system for use in enabling acquisition of sample characterizing data for measuring thickness and optical properties of semiconductor, disk drive, magnetic data, storage media, optical data storage media, thin films and multiple layer films on substrates and coatings, including temperature caused effects

ELLIPSOMETERS, POLARIMETERS, AND REFLECTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVESTIGATE SAMPLE SYSTEMS