FEI COMPANY TOOLS FOR NANOTECH Trademark

Trademark Overview


On Wednesday, June 1, 2005, a trademark application was filed for FEI COMPANY TOOLS FOR NANOTECH with the United States Patent and Trademark Office. The USPTO has given the FEI COMPANY TOOLS FOR NANOTECH trademark a serial number of 78641626. The federal status of this trademark filing is CANCELLED - SECTION 8 as of Friday, December 26, 2014. This trademark is owned by FEI Company. The FEI COMPANY TOOLS FOR NANOTECH trademark is filed in the Machinery Products, Computer & Software Products & Electrical & Scientific Products, Construction & Repair Services, Education & Entertainment Services, and Computer & Software Services & Scientific Services categories with the following description:

Components of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, high brightness, sub-micron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, imaging, and ion beam milling, secondary ion mass spectrometry, focused electron beam columns for electron beam lithography, and electron beam microscopy and analysis, ion beam source emitters, electron beam source emitters; accessories of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, sample preparation equipment that prepares biological samples for examination by microscopes

Focused ion beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; Microscopes, scanning electron microscopes, scanning ion microscopes, atomic-force microscopes, and transmission electron microscopes; Microscopic system navigational software, namely, software that visually enhances the navigational, functional capability of spectroscopic, lithographic, and microscopic components; Application software and operation system software for operation of all the foregoing equipment, namely, software for use in microscopic imaging, milling and analysis; Computer software for manufacturing semi-conductors; Computer software for manufacturing data storage components; and computer software for manufacturing micro-machinery

Repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes; post-warranty repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes

Training in the operation of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes

Scientific analysis and high resolution imaging, namely, scanning electron and focused ion beam microscopy, in the fields of semiconductor manufacture, data storage equipment manufacture, scientific research, biological sciences and manufacture of devices with sub-micron features; Computer software support services, namely, trouble shooting of computer software problems, providing back up for computer software programs; Computer software consultation services; design and updating of computer software; project management relating to computer software; Computer software installation and maintenance; Providing information and advice relating to computer software
fei company tools for nanotech

General Information


Serial Number78641626
Word MarkFEI COMPANY TOOLS FOR NANOTECH
Filing DateWednesday, June 1, 2005
Status710 - CANCELLED - SECTION 8
Status DateFriday, December 26, 2014
Registration Number3431150
Registration DateTuesday, May 20, 2008
Mark Drawing3000 - Illustration: Drawing or design which also includes word(s) / letter(s) / number(s)
Published for Opposition DateTuesday, March 4, 2008

Trademark Statements


Indication of Colors claimedColor is not claimed as a feature of the mark.
Disclaimer with Predetermined Text"COMPANY TOOLS FOR NANOTECH"
Goods and ServicesComponents of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, high brightness, sub-micron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, imaging, and ion beam milling, secondary ion mass spectrometry, focused electron beam columns for electron beam lithography, and electron beam microscopy and analysis, ion beam source emitters, electron beam source emitters; accessories of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, sample preparation equipment that prepares biological samples for examination by microscopes
Goods and ServicesFocused ion beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; Microscopes, scanning electron microscopes, scanning ion microscopes, atomic-force microscopes, and transmission electron microscopes; Microscopic system navigational software, namely, software that visually enhances the navigational, functional capability of spectroscopic, lithographic, and microscopic components; Application software and operation system software for operation of all the foregoing equipment, namely, software for use in microscopic imaging, milling and analysis; Computer software for manufacturing semi-conductors; Computer software for manufacturing data storage components; and computer software for manufacturing micro-machinery
Goods and ServicesRepair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes; post-warranty repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes
Goods and ServicesTraining in the operation of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes
Goods and ServicesScientific analysis and high resolution imaging, namely, scanning electron and focused ion beam microscopy, in the fields of semiconductor manufacture, data storage equipment manufacture, scientific research, biological sciences and manufacture of devices with sub-micron features; Computer software support services, namely, trouble shooting of computer software problems, providing back up for computer software programs; Computer software consultation services; design and updating of computer software; project management relating to computer software; Computer software installation and maintenance; Providing information and advice relating to computer software

Classification Information


International Class007 - Machines and machine tools; motors and engines (except for land vehicles); machine coupling and transmission components (except for land vehicles); agricultural implements other than hand-operated; incubators for eggs.
US Class Codes013, 019, 021, 023, 031, 034, 035
Class Status Code2 - Sec. 8 - Entire Registration
Class Status DateFriday, December 26, 2014
Primary Code007
First Use Anywhere DateWednesday, March 31, 2004
First Use In Commerce DateWednesday, March 31, 2004

International Class009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
US Class Codes021, 023, 026, 036, 038
Class Status Code2 - Sec. 8 - Entire Registration
Class Status DateFriday, December 26, 2014
Primary Code009
First Use Anywhere DateWednesday, March 31, 2004
First Use In Commerce DateWednesday, March 31, 2004

International Class037 - Building construction; repair; installation services.
US Class Codes100, 103, 106
Class Status Code2 - Sec. 8 - Entire Registration
Class Status DateFriday, December 26, 2014
Primary Code037
First Use Anywhere DateWednesday, March 31, 2004
First Use In Commerce DateWednesday, March 31, 2004

International Class041 - Education; providing of training; entertainment; sporting and cultural activities.
US Class Codes100, 101, 107
Class Status Code2 - Sec. 8 - Entire Registration
Class Status DateFriday, December 26, 2014
Primary Code041
First Use Anywhere DateWednesday, March 31, 2004
First Use In Commerce DateWednesday, March 31, 2004

International Class042 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software.
US Class Codes100, 101
Class Status Code2 - Sec. 8 - Entire Registration
Class Status DateFriday, December 26, 2014
Primary Code042
First Use Anywhere DateWednesday, March 31, 2004
First Use In Commerce DateWednesday, March 31, 2004

Trademark Owner History


Party NameFEI Company
Party Type30 - Original Registrant
Legal Entity Type03 - Corporation
AddressHillsboro, OR 97124

Party NameFEI Company
Party Type20 - Owner at Publication
Legal Entity Type03 - Corporation
AddressHillsboro, OR 97124

Party NameFEI Company
Party Type10 - Original Applicant
Legal Entity Type03 - Corporation
AddressHillsboro, OR 97124

Trademark Events


Event DateEvent Description
Friday, December 26, 2014CANCELLED SEC. 8 (6-YR)
Tuesday, May 20, 2008REGISTERED-PRINCIPAL REGISTER
Tuesday, March 4, 2008PUBLISHED FOR OPPOSITION
Wednesday, February 13, 2008NOTICE OF PUBLICATION
Thursday, January 31, 2008LAW OFFICE PUBLICATION REVIEW COMPLETED
Friday, January 11, 2008APPROVED FOR PUB - PRINCIPAL REGISTER
Friday, January 11, 2008EXAMINER'S AMENDMENT ENTERED
Friday, January 11, 2008NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED
Friday, January 11, 2008EXAMINERS AMENDMENT E-MAILED
Friday, January 11, 2008EXAMINERS AMENDMENT -WRITTEN
Thursday, January 10, 2008ASSIGNED TO EXAMINER
Thursday, January 10, 2008PREVIOUS ALLOWANCE COUNT WITHDRAWN
Thursday, January 10, 2008ASSIGNED TO EXAMINER
Monday, January 7, 2008ASSIGNED TO EXAMINER
Monday, August 6, 2007WITHDRAWN FROM PUB - OG REVIEW QUERY
Wednesday, May 23, 2007LAW OFFICE PUBLICATION REVIEW COMPLETED
Sunday, May 20, 2007APPROVED FOR PUB - PRINCIPAL REGISTER
Sunday, May 20, 2007EXAMINER'S AMENDMENT ENTERED
Sunday, May 20, 2007EXAMINERS AMENDMENT E-MAILED
Sunday, May 20, 2007EXAMINERS AMENDMENT -WRITTEN
Wednesday, May 16, 2007PREVIOUS ALLOWANCE COUNT WITHDRAWN
Monday, March 26, 2007WITHDRAWN FROM PUB - OG REVIEW QUERY
Thursday, March 1, 2007LAW OFFICE PUBLICATION REVIEW COMPLETED
Saturday, February 17, 2007APPROVED FOR PUB - PRINCIPAL REGISTER
Friday, February 16, 2007EXAMINER'S AMENDMENT ENTERED
Friday, February 16, 2007ASSIGNED TO LIE
Thursday, February 15, 2007EXAMINERS AMENDMENT E-MAILED
Thursday, February 15, 2007EXAMINERS AMENDMENT -WRITTEN
Tuesday, August 15, 2006FINAL REFUSAL E-MAILED
Tuesday, August 15, 2006FINAL REFUSAL WRITTEN
Thursday, July 27, 2006AMENDMENT FROM APPLICANT ENTERED
Monday, July 3, 2006CORRESPONDENCE RECEIVED IN LAW OFFICE
Monday, July 3, 2006PAPER RECEIVED
Thursday, January 5, 2006NON-FINAL ACTION E-MAILED
Thursday, January 5, 2006NON-FINAL ACTION WRITTEN
Wednesday, December 21, 2005ASSIGNED TO EXAMINER
Wednesday, June 8, 2005NEW APPLICATION ENTERED IN TRAM