| Serial Number | 76347903 |
| Word Mark | FATHOM |
| Filing Date | Tuesday, December 11, 2001 |
| Status | 710 - CANCELLED - SECTION 8 |
| Status Date | Friday, August 27, 2010 |
| Registration Number | 2807148 |
| Registration Date | Tuesday, January 20, 2004 |
| Mark Drawing | 1000 - Typeset: Word(s) / letter(s) / number(s) |
| Published for Opposition Date | Tuesday, January 14, 2003 |
| Goods and Services | Inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes, for use in the manufacturing and testing of semiconductors |
| Goods and Services | Installation, maintenance and repair of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes |
| Goods and Services | Custom manufacture of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes |
| Goods and Services | On-site and off-site inspection services for the semiconductor industry, namely wafer inspection, reticle inspection, defect detection, defect review, defect classification, nanotopography measurement, wafer flatness measurement, surface profiling, film thickness measurement, critical dimension measurement, and microscopy; and leasing and consultation of inspection and test equipment for the semiconductor industry, namely wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes; design of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes |
| International Class | 009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus. |
| US Class Codes | 021, 023, 026, 036, 038 |
| Class Status Code | 2 - Sec. 8 - Entire Registration |
| Class Status Date | Friday, August 27, 2010 |
| Primary Code | 009 |
| First Use Anywhere Date | Wednesday, July 3, 2002 |
| First Use In Commerce Date | Wednesday, July 3, 2002 |
| International Class | 037 - Building construction; repair; installation services. |
| US Class Codes | 100, 103, 106 |
| Class Status Code | 2 - Sec. 8 - Entire Registration |
| Class Status Date | Friday, August 27, 2010 |
| Primary Code | 037 |
| First Use Anywhere Date | Wednesday, July 3, 2002 |
| First Use In Commerce Date | Wednesday, July 3, 2002 |
| International Class | 040 - Treatment of materials. |
| US Class Codes | 100, 103, 106 |
| Class Status Code | 2 - Sec. 8 - Entire Registration |
| Class Status Date | Friday, August 27, 2010 |
| Primary Code | 040 |
| First Use Anywhere Date | Wednesday, July 3, 2002 |
| First Use In Commerce Date | Wednesday, July 3, 2002 |
| International Class | 042 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software. |
| US Class Codes | 100, 101 |
| Class Status Code | 2 - Sec. 8 - Entire Registration |
| Class Status Date | Friday, August 27, 2010 |
| Primary Code | 042 |
| First Use Anywhere Date | Wednesday, July 3, 2002 |
| First Use In Commerce Date | Wednesday, July 3, 2002 |
| Party Name | NLINE CORPORATION |
| Party Type | 30 - Original Registrant |
| Legal Entity Type | 03 - Corporation |
| Address | Austin, TX 78744 |
| Party Name | NLINE CORPORATION |
| Party Type | 20 - Owner at Publication |
| Legal Entity Type | 03 - Corporation |
| Address | Austin, TX 78744 |
| Party Name | NLINE CORPORATION |
| Party Type | 10 - Original Applicant |
| Legal Entity Type | 03 - Corporation |
| Address | Austin, TX 78744 |
| Event Date | Event Description |
| Friday, August 27, 2010 | CANCELLED SEC. 8 (6-YR) |
| Tuesday, January 20, 2004 | REGISTERED-PRINCIPAL REGISTER |
| Wednesday, November 26, 2003 | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED |
| Monday, November 24, 2003 | ASSIGNED TO EXAMINER |
| Friday, November 21, 2003 | CASE FILE IN TICRS |
| Monday, November 10, 2003 | STATEMENT OF USE PROCESSING COMPLETE |
| Thursday, November 6, 2003 | EXTENSION 1 GRANTED |
| Monday, October 6, 2003 | USE AMENDMENT FILED |
| Monday, October 6, 2003 | EXTENSION 1 FILED |
| Monday, October 6, 2003 | PAPER RECEIVED |
| Tuesday, April 8, 2003 | NOA MAILED - SOU REQUIRED FROM APPLICANT |
| Tuesday, January 14, 2003 | PUBLISHED FOR OPPOSITION |
| Wednesday, December 25, 2002 | NOTICE OF PUBLICATION |
| Thursday, November 14, 2002 | APPROVED FOR PUB - PRINCIPAL REGISTER |
| Wednesday, November 6, 2002 | EXAMINERS AMENDMENT MAILED |
| Tuesday, September 24, 2002 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| Tuesday, September 24, 2002 | PAPER RECEIVED |
| Wednesday, March 27, 2002 | NON-FINAL ACTION MAILED |
| Wednesday, March 13, 2002 | ASSIGNED TO EXAMINER |