| Goods and Services | SCIENTIFIC APPARATUS AND INSTRUMENTS, namely, SPECTROSCOPES FOR ELECTRON SPECTROSCOPY, ION SPECTROSCOPY AND GAS AND ELEMENTAL ANALYSIS; [ MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYSIS WHICH USE METHODS FOR SPECTROSCOPY AND MICROSCOPY BASED ON ELECTRONS, IONS AND PHOTONS; ] * MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS; * EXCITATION SOURCES, IN PARTICULAR ELECTRON TUBES, LASERS FOR NON-MEDICAL PURPOSES, PULSE GENERATORS FOR TESTING ELECTRIC CURRENT, OPTICAL LAMPS AND LED LIGHT EMITTING DIODES, WITH ULTRAVIOLET LIGHT, X-RAYS AND ELECTRONS FOR USE IN SCIENTIFIC APPARATUS AND INSTRUMENTS; [ ACCESSORIES FOR SCIENTIFIC APPARATUS AND INSTRUMENTS AND FOR MEASURING APPARATUS AND INSTRUMENTS, namely, DEPTH GAUGES FOR SCANNING PROBE MICROSCOPES; ] PROBES AND SENSORS FOR USE WITH ELECTRON SPECTROSCOPY AND GAS ANALYSIS AND FOR MEASURING APPARATUS AND INSTRUMENTS FOR SCIENTIFIC PURPOSES; DATA PROCESSING APPARATUS * FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * ; COMPUTER SOFTWARE FOR DATABASE MANAGEMENT; COMPUTER PROGRAMS FOR THE TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA, AND COMPUTER PROGRAMS FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS * FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * ; [ ELECTRIC AND ELECTRONIC CONTROL APPARATUS AND INSTRUMENTS, IN PARTICULAR FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS, IN PARTICULAR SPECTROSCOPES FOR ELECTRON SPECTROSCOPY, ION SPECTROSCOPY AND GAS AND ELEMENTAL ANALYSIS ] * ELECTRIC AND ELECTRONIC CONTROL APPARATUS AND INSTRUMENTS, namely, FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * |
| Certificate of Correction for Registration | In the Statement, Page 1, lines 7-10, "measuring apparatus and instruments for material analysis which use methods for spectroscopy and microscopy based on electrons, ions and photons;" should be deleted, and, "measuring apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons;" should be inserted, and, In the Statement, Page 1, line 20, after APPARATUS, "apparatus for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons;" should be inserted, and, In the Statement, Page 1, line 23, after, INSTRUMENTS, "for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons" should be inserted, and, In the Statement, Page 1, lines 23-27, " electric and electronic control apparatus and instruments, in particular for the control of scientific apparatus and instruments, in particular spectroscopes for electron spectroscopy, ion spectroscopy and gas and elemental analysis " should be deleted, and, "electric and electronic control apparatus and instruments, namely for the control of scientific apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons" should be inserted, and, In the Statement, Page 1, lines 37- Page 2, line 2, "Scientific and technological services, namely, research and design related to the analysis of surfaces in relation to the design, assembly and operation of measuring apparatus and instruments for material analysis which use methods for spectroscopy and microscopy based on electrons, ions and photons; research in the field of semiconductor processing technology; industrial analysis and research services in the field of surfaces of materials; " should be deleted, and, "Scientific and technological services and research and related design services related to the analysis of surfaces, each services in connection with the design, the installation and the operation of measuring apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons; research in the field of technology for analyzing surfaces; industrial analysis and research services relating to material surfaces;" should be inserted, and, In the Statement, Page 2, line 7 and line 10, after INSTRUMENTS, "for analyzing surfaces" should be inserted, and, In the Statement, Page 2, line 8, after DATA, "when analyzing surfaces" should be inserted, and, In the Statement, Page 2, line 11, after RESEARCH, "for analyzing surfaces" should be inserted, and, In the Statement, Page 2, line 12 and 13,"and design engineering for the processing of web products" should be deleted, and, "in connection with the design, the installation and the operation of measuring apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons" should be inserted. |
| Goods and Services | [ SCIENTIFIC AND TECHNOLOGICAL SERVICES, NAMELY, RESEARCH AND DESIGN RELATED TO THE ANALYSIS OF SURFACES IN RELATION TO THE DESIGN, ASSEMBLY AND OPERATION OF MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYSIS WHICH USE METHODS FOR SPECTROSCOPY AND MICROSCOPY BASED ON ELECTRONS, IONS AND PHOTONS; RESEARCH IN THE FIELD OF SEMICONDUCTOR PROCESSING TECHNOLOGY; INDUSTRIAL ANALYSIS AND RESEARCH SERVICES IN THE FIELD OF SURFACES OF MATERIALS; ] * SCIENTIFIC AND TECHNOLOGICAL SERVICES AND RESEARCH AND RELATED DESIGN SERVICES RELATED TO THE ANALYSIS OF SURFACES, EACH SERVICES IN CONNECTION WITH THE DESIGN, THE INSTALLATION AND THE OPERATION OF MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS; RESEARCH IN THE FIELD OF TECHNOLOGY FOR ANALYZING SURFACES; INDUSTRIAL ANALYSIS AND RESEARCH SERVICES RELATING TO MATERIAL SURFACES * DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE, IN PARTICULAR DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE FOR TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA AND COMPUTER PROGRAMS FOR CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS * FOR ANALYZING SURFACES * ; UPDATING COMPUTER SOFTWARE, IN PARTICULAR UPDATING COMPUTER SOFTWARE FOR TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA * WHEN ANALYZING SURFACES * AND UPDATING OF COMPUTER PROGRAMS FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS * FOR ANALYZING SURFACES * ; ENGINEERING AND PHYSICS RESEARCH * FOR ANALYZING SURFACES * ; ENGINEERING SERVICES, PARTICULARLY TECHNICAL PROJECT PLANNING [ AND DESIGN ENGINEERING FOR THE PROCESSING OF WEB PRODUCTS] * IN CONNECTION WITH THE DESIGN, THE INSTALLATION AND THE OPERATION OF MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * |
