ATBASED ON K.I.S.S. Trademark

Trademark Overview


On Tuesday, February 12, 2002, a trademark application was filed for ATBASED ON K.I.S.S. with the United States Patent and Trademark Office. The USPTO has given the ATBASED ON K.I.S.S. trademark a serial number of 78108225. The federal status of this trademark filing is CANCELLED - SECTION 8 as of Friday, April 29, 2011. This trademark is owned by Advantest Corporation. The ATBASED ON K.I.S.S. trademark is filed in the Computer & Software Products & Electrical & Scientific Products, Construction & Repair Services, and Computer & Software Services & Scientific Services categories with the following description:

Measuring apparatus and instruments, namely, temperature sensors, temperature simulation equipment, a temperature range test module and an output module, infrared imaging units, thermometers thermocouples, and thermal analyzers for use in measuring, analyzing and diagnosis of temperature in the fields of manufacturing and testing integrated circuits, large integrated circuits, integrated circuit devices, semiconductor elements, semiconductor devices, electronic components and electronic assemblies composed thereof; multifunctional equipment and apparatus, namely, multi-channel digital recorders in the nature of temperature indicators incorporating voltmeters for use in measuring temperature and voltage and resistance for use in measuring, analyzing and diagnosis both of temperature and electronic signals in the fields of manufacturing and testing integrated circuits, large integrated circuits, integrated circuit devices semiconductor elements, semiconductor devices, electronic componen...

Machinery installation; advisory services for machinery installation; repair and maintenance of testing machines for large scale integrated circuits and other semiconductors, and parts and accessories thereof; Repair and maintenance of electrical communication machines and apparatus; repair and maintenance of measuring apparatus and instruments

Computer software design, computer programming and computer maintenance for others involving computer programs used for manufacturing machines and testing machines for integrated circuits, large scale integrated circuits, and other semiconductors; technical consultation regarding manufacturing machines and testing machines for integrated circuits, large scale integrated circuits, and other semiconductors, and testing lines consisting of aforesaid machines; product design for others, namely, design of manufacturing machines and testing machines for integrated circuits, large scale integrated circuits, other semiconductors, and industrial plants consisting of the aforesaid machines; testing and technical research on manufacturing machines and testing machines for integrated circuits, large scale integrated circuits and other semiconductors, and testing lines consisting of aforesaid machines; and rental of computers and other peripheral equipment, namely, central processor and electronic ...
atbased on k.i.s.s.

General Information


Serial Number78108225
Word MarkATBASED ON K.I.S.S.
Filing DateTuesday, February 12, 2002
Status710 - CANCELLED - SECTION 8
Status DateFriday, April 29, 2011
Registration Number2888813
Registration DateTuesday, September 28, 2004
Mark Drawing3000 - Illustration: Drawing or design which also includes word(s) / letter(s) / number(s)
Published for Opposition DateTuesday, March 23, 2004

Trademark Statements


Goods and ServicesMeasuring apparatus and instruments, namely, temperature sensors, temperature simulation equipment, a temperature range test module and an output module, infrared imaging units, thermometers thermocouples, and thermal analyzers for use in measuring, analyzing and diagnosis of temperature in the fields of manufacturing and testing integrated circuits, large integrated circuits, integrated circuit devices, semiconductor elements, semiconductor devices, electronic components and electronic assemblies composed thereof; multifunctional equipment and apparatus, namely, multi-channel digital recorders in the nature of temperature indicators incorporating voltmeters for use in measuring temperature and voltage and resistance for use in measuring, analyzing and diagnosis both of temperature and electronic signals in the fields of manufacturing and testing integrated circuits, large integrated circuits, integrated circuit devices semiconductor elements, semiconductor devices, electronic components and electronic assemblies composed thereof; electrical and magnetic measuring instruments, namely, voltmeters, ammeters, digital multimeters equipped with DC voltage/current generators, spectrum analyzers, network analyzers, optical spectrum analyzers, optical network analyzers, optical time domain reflectmeter, pulse pattern generator, error detector, protocol analyzer, digital spectrum analyzers, and bluetooth testers for use in measuring, analyzing and diagnosis of electronic signals, optical signals and impedance in the field of manufacturing and testing integrated circuits, large integrated circuits, integrated circuit devices, semiconductor elements, semiconductor devices and electronic components and assemblies thereof; laser diode test system, namely, meters and testers for use in the analyzing and testing of laser beams comprised primarily of mainframes consisting of display and optical units, connecting cables, emitters, detectors, wave-form distortion analyzers, ratio meters wave-noise figure meters, and electronic instruments for testing bit error rates; electronic testing machines for large scale integrated circuits and semiconductors, and parts and accessories thereof; namely, electronic machines and apparatus equipped with test handlers in the nature of test handlers and integrated circuit handlers for use in measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, integrated circuit devices, semiconductor elements, and semiconductor devices in the field of manufacturing and testing LSI (Large Scale Integrated Circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated Circuits) Test System, Mixed-signal Test System, LCD (Liquid Crystal Display Driver) Test System, Imagesensor Test System, E-beamTest System; computer software for use in testing machines for large-scale integrated circuits and semiconductors and parts and accessories thereof
Goods and ServicesMachinery installation; advisory services for machinery installation; repair and maintenance of testing machines for large scale integrated circuits and other semiconductors, and parts and accessories thereof; Repair and maintenance of electrical communication machines and apparatus; repair and maintenance of measuring apparatus and instruments
Goods and ServicesComputer software design, computer programming and computer maintenance for others involving computer programs used for manufacturing machines and testing machines for integrated circuits, large scale integrated circuits, and other semiconductors; technical consultation regarding manufacturing machines and testing machines for integrated circuits, large scale integrated circuits, and other semiconductors, and testing lines consisting of aforesaid machines; product design for others, namely, design of manufacturing machines and testing machines for integrated circuits, large scale integrated circuits, other semiconductors, and industrial plants consisting of the aforesaid machines; testing and technical research on manufacturing machines and testing machines for integrated circuits, large scale integrated circuits and other semiconductors, and testing lines consisting of aforesaid machines; and rental of computers and other peripheral equipment, namely, central processor and electronic circuits, magnetic discs and magnetic tapes with computers
Pseudo MarkAT BASED ON KISS

Classification Information


International Class009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus.
US Class Codes021, 023, 026, 036, 038
Class Status Code2 - Sec. 8 - Entire Registration
Class Status DateFriday, April 29, 2011
Primary Code009
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

International Class037 - Building construction; repair; installation services.
US Class Codes100, 103, 106
Class Status Code2 - Sec. 8 - Entire Registration
Class Status DateFriday, April 29, 2011
Primary Code037
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

International Class042 - Scientific and technological services and research and design relating thereto; industrial analysis and research services; design and development of computer hardware and software.
US Class Codes100, 101
Class Status Code2 - Sec. 8 - Entire Registration
Class Status DateFriday, April 29, 2011
Primary Code042
First Use Anywhere DateNOT AVAILABLE
First Use In Commerce DateNOT AVAILABLE

Trademark Owner History


Party NameAdvantest Corporation
Party Type30 - Original Registrant
Legal Entity Type03 - Corporation
AddressTokyo
JP

Party NameAdvantest Corporation
Party Type20 - Owner at Publication
Legal Entity Type03 - Corporation
AddressTokyo
JP

Party NameAdvantest Corporation
Party Type10 - Original Applicant
Legal Entity Type03 - Corporation
AddressTokyo
JP

Trademark Events


Event DateEvent Description
Friday, April 29, 2011CANCELLED SEC. 8 (6-YR)
Tuesday, September 28, 2004REGISTERED-PRINCIPAL REGISTER
Thursday, July 29, 2004Sec. 1(B) CLAIM DELETED
Thursday, July 29, 2004NOTICE OF ALLOWANCE CANCELLED
Thursday, July 29, 2004PAPER RECEIVED
Wednesday, July 14, 2004FAX RECEIVED
Tuesday, June 15, 2004NOA MAILED - SOU REQUIRED FROM APPLICANT
Tuesday, March 23, 2004PUBLISHED FOR OPPOSITION
Wednesday, March 3, 2004NOTICE OF PUBLICATION
Monday, January 12, 2004APPROVED FOR PUB - PRINCIPAL REGISTER
Friday, November 14, 2003CORRESPONDENCE RECEIVED IN LAW OFFICE
Monday, December 22, 2003CASE FILE IN TICRS
Friday, November 14, 2003PAPER RECEIVED
Wednesday, May 14, 2003FINAL REFUSAL E-MAILED
Thursday, April 17, 2003CORRESPONDENCE RECEIVED IN LAW OFFICE
Thursday, April 17, 2003PAPER RECEIVED
Thursday, January 23, 2003LETTER OF SUSPENSION E-MAILED
Friday, November 29, 2002PAPER RECEIVED
Wednesday, December 4, 2002CORRESPONDENCE RECEIVED IN LAW OFFICE
Wednesday, December 4, 2002PAPER RECEIVED
Friday, October 11, 2002ASSIGNED TO EXAMINER
Saturday, June 29, 2002NON-FINAL ACTION E-MAILED
Friday, June 21, 2002ASSIGNED TO EXAMINER