Serial Number | 75782708 |
Word Mark | ASI |
Filing Date | Tuesday, August 24, 1999 |
Status | 602 - ABANDONED - FAILURE TO RESPOND OR LATE RESPONSE |
Status Date | Wednesday, February 14, 2001 |
Registration Number | 0000000 |
Registration Date | NOT AVAILABLE |
Mark Drawing | 3000 - Illustration: Drawing or design which also includes word(s) / letter(s) / number(s) |
Published for Opposition Date | NOT AVAILABLE |
Goods and Services | SILICON AND COMPUTER CHIPS, PHOTOMASK SUBSTRATES FOR INTEGRATED CIRCUITS, NETWORK CARDS, SEMICONDUCTOR DEVICES, AND INTEGRATED CIRCUITS |
Lining/Stippling Statement | The stippling is for shading purposes. |
Pseudo Mark | ASI |
International Class | 009 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus. |
US Class Codes | 021, 023, 026, 036, 038 |
Class Status Code | 6 - Active |
Class Status Date | Monday, November 15, 1999 |
Primary Code | 009 |
First Use Anywhere Date | NOT AVAILABLE |
First Use In Commerce Date | NOT AVAILABLE |
Party Name | ADVANTECH SEMICONDUCTOR INC. |
Party Type | 10 - Original Applicant |
Legal Entity Type | 03 - Corporation |
Address | Hsinchu Hsien TW |
Event Date | Event Description |
Wednesday, February 14, 2001 | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE |
Tuesday, February 13, 2001 | ASSIGNED TO EXAMINER |
Friday, June 9, 2000 | FINAL REFUSAL MAILED |
Friday, May 5, 2000 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
Monday, December 20, 1999 | NON-FINAL ACTION MAILED |
Thursday, December 16, 1999 | ASSIGNED TO EXAMINER |